Delayed processing of site-aware objects

Abstract

A device is tested using a system that includes automatic test equipment (ATE) and a computer. At the ATE, the testing includes receiving data from the device, and processing the data to obtain processed data. At the computer, the testing includes executing a computer program while the data is being processed at the ATE, where the computer program processes an object that contains a pointer, passing the object to the ATE, and receiving the object from the ATE. The pointer in the object is replaced with the processed data.

Description

CLAIM TO PRIORITY[0001]This patent application claims priority to U.S. Provisional Application No. 60 / 676,003, filed on Apr. 29, 2005, the contents of which are hereby incorporated by reference into this application as if set forth herein in full.TECHNICAL FIELD[0002]This patent application relates generally to automatic test equipment (ATE) and, more particularly, to delaying processing of objects containing ATE test data.BACKGROUND[0003]ATE refers to an automated, usually computer-driven, approach to testing devices, such as semiconductors, electronic circuits, and printed circuit board assemblies. A device tested by ATE, such as a semiconductor device, is referred to as a device under test (DUT).[0004]A test system may include ATE and a host computer. Data from a DUT may be preliminarily processed in the ATE, and then passed to the host computer for subsequent processing. The processing that occurs in the ATE and in the host computer is typically asynchronous, meaning that there ...

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