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Seal ring structure, semiconductor wafer, and method for reducing stress effect due to cutting

A sealing ring, semiconductor technology, used in semiconductor devices, semiconductor/solid-state device manufacturing, semiconductor/solid-state device components and other directions

Active Publication Date: 2008-07-09
TAIWAN SEMICON MFG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Therefore, the plugs in the existing sealing ring structure need to be better designed to limit and prevent the advancement of cracks from the edge of the integrated circuit chip

Method used

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  • Seal ring structure, semiconductor wafer, and method for reducing stress effect due to cutting
  • Seal ring structure, semiconductor wafer, and method for reducing stress effect due to cutting
  • Seal ring structure, semiconductor wafer, and method for reducing stress effect due to cutting

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Embodiment Construction

[0044] In order to make the above and other objects, features and advantages of the present invention more comprehensible, a preferred embodiment is specifically cited below, together with the accompanying drawings, and is described in detail as follows:

[0045]The invention discloses a sealing ring structure, which has strong physical strength and includes multiple metallization layers, which can preferably limit and prevent the advancement of cracks. The sealing ring structure is in a region between a core circuit and the edge of an integrated circuit chip and has a thick structure. This structure is a stack formed by upper bridges and lower bridges. Can provide greater mass and strength for improved resistance to crack intrusion.

[0046] A common failure situation that an integrated circuit chip may encounter is the generation and propagation of stress cracks from the edge of the integrated circuit chip. Such a failure can be achieved by Figure 1A This is caused by th...

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Abstract

A seal ring structure is disclosed for protecting a core circuit region of an integrated circuit chip. The seal ring structure includes a metallization layer, having a bridge sublevel and a plug sublevel. An upper-level bridge is formed on the bridge sublevel at a predetermined location between a peripheral edge of the integrated circuit chip and the core circuit region. A lower-level bridge is formed on the plug sublevel in substantial alignment with the upper-level bridge, wherein the lower-level bridge has a width substantially the same as that of the upper-level bridge.

Description

technical field [0001] The present invention relates to the design of semiconductor integrated circuit chips, and more particularly to a sealing ring structure (sealing ring structure), which has sufficient physical strength to limit and prevent the formation of corners and edges of integrated circuit chips. advance of the crack. Background technique [0002] Integrated circuit chips are manufactured in a rectangular array on a circular single crystal wafer. Most wafers are formed from silicon. Wafers can be divided by scribing, breaking, stress breaking or most commonly sawing. The separation line is aligned with the selected crystal axis, so that the separation of the wafers can be performed in a sequence and in a predetermined manner. However, this separation procedure still inevitably results in unintentional stress cracks. Such cracks occur at most near the corners of the integrated circuit chip where two perpendicular dividing lines intersect. Such fractures also ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/00H01L27/02
CPCH01L2924/3011H01L21/78H01L23/585H01L21/76224H01L2924/0002B28D5/0011H01L23/562H01L2924/00
Inventor 姚志翔黄泰钧纪冠守郑志成梁明硕万文恺夏劲秋梁孟松
Owner TAIWAN SEMICON MFG CO LTD
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