Temp. measuring circuit of corrected by translation conversion reference level
A temperature measurement circuit and reference level technology, applied to thermometers, thermometers, and measuring devices that use directly heat-sensitive electric/magnetic components, can solve energy consumption and temperature changes, increase operating frequency, and reduce temperature measurement Problems such as circuit 10 response speed
Inactive Publication Date: 2008-12-24
GLOBAL MIXED MODE TECH
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Problems solved by technology
However, existing excitation methods using three or more different currents not only cause a rapid increase in operating frequency but also cause unnecessary power consumption and temperature fluctuations
Even under the condition that the operating frequency remains fixed, the sequential excitation of more different currents will inevitably prolong the time required for each temperature measurement cycle, thereby reducing the response speed of the temperature measurement circuit 10
[0007] On the other hand, what the temperature measurement circuit 10 actually measures is the temperature of the semiconductor substrate on which the thermal sensor 21 is formed, and this measurement result may be different from the true representative temperature of the external system 20
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[0040] The foregoing and other objects, features, and advantages of the present invention will be more apparent from the following description and accompanying drawings. Preferred embodiments according to the present invention will now be described in detail with reference to the accompanying drawings.
[0041] FIG. 2 shows a schematic diagram of the circuit composition of the temperature measurement circuit 30 according to the present invention. In the temperature measurement circuit 30 , a current excitation circuit is composed of a measurement current source circuit 31 , a calibration current source circuit 32 , a measurement control circuit 33 , and a calibration control circuit 34 . The measurement current source circuit 31 has a first and a second measurement current I 1 with I 2 , respectively via switch S 1 with S 2 and supplied to the emitter of the thermal sensor 21 . Correction current source circuit 32 has a correction current I 3 , via switch S 3 and supplied...
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A temperature measuring circuit utilizing translation converting reference level to carry out calibration is prepared as exerting at least two currents on heat transducer by current exciting circuit to let heat transducer generate two output signals correspondingly, using calculation circuit to calculate out an analog temperature signal representing temperature detected by heat detector, converting analog signal to be digital temperature signal by A / D conversion circuit according to a conversion reference level, carrying out translation regulation of said reference level according to calibration value generated by calibration value generation circuit.
Description
technical field [0001] The invention relates to a temperature measurement circuit, in particular to a temperature measurement circuit which realizes error correction function by shifting the conversion reference level of the analog to digital conversion circuit. Background technique [0002] Since the potential difference between the semiconductor pn junction of the diode component or the semiconductor pn junction between the base and the emitter of the transistor component and the current flowing through it are related to each other and are a function of temperature, in integrated circuit technology This semiconductor pn junction is widely used in the field to detect temperature. figure 1 A schematic diagram of the circuit composition of the existing temperature measurement circuit 10 is shown. Typically, the temperature measurement circuit 10 is configured to monitor the temperature of an external system 20 . For example, the external system 20 is a computer, an electron...
Claims
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IPC IPC(8): G01K7/01G01K7/42
Inventor 邱瑞德
Owner GLOBAL MIXED MODE TECH