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Object microfall besting method and apparatus

A testing method and testing device technology, applied in measuring devices, impact testing, testing of machine/structural parts, etc., can solve problems such as low testing efficiency and achieve the effect of improving production efficiency

Inactive Publication Date: 2009-05-06
SHANGHAI CHENXING ELECTRONICS SCI & TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Only one object to be tested can be tested at a time, and the test efficiency is low

Method used

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  • Object microfall besting method and apparatus
  • Object microfall besting method and apparatus
  • Object microfall besting method and apparatus

Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0020] The preferred embodiments of the present invention are given below in conjunction with the accompanying drawings to describe the technical solution of the present invention in detail.

[0021] An object drop test method, the object 7 to be tested is placed on the supporting plate 2, and the supporting plate 2 slowly rises from the initial position, that is, the low point position, to the test height, that is, the high point position.

[0022] After stabilization, the supporting plate 2 rapidly descends to the initial position under the action of the cylinder, and is in a horizontal static state. The object 7 to be measured is separated from the pallet and falls freely. After time T 2 Fall to the starting position, hit the supporting plate 2, and complete a test process.

[0023] The time for pallet 2 to return to the starting position from the high point position is T 1 , when T 1 2 , the supporting plate 2 returns to the starting position earlier.

[0024] The aver...

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PUM

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Abstract

The invention discloses an object micro-drop testing method that locates test object on a pallet, which would rapidly descend from high location to knock the test object at lower location. The invention also discloses an object micro-drop testing device that includes a cylinder, and a pallet connecting to the pallet. The invention could test plural testing objects to improve working efficiency.

Description

technical field [0001] The invention relates to a method and a device for performing a micro-drop test on an object. Background technique [0002] The traditional drop test equipment includes a workbench, motor, cylinder, photoelectric switch and some auxiliary devices. Its working principle is: put the object to be tested in the designated area of ​​the workbench, and there are baffles around it for reset (when the test object falls to the initial position, it is used to reset the test object), and the clamps on both sides are realized by the cylinder. Clamping and loosening, the clamp clamps the test object and moves up and down through the motor. When the test object is lifted to the test height (controlled by the limit switch), the relay controls the cylinder to release the clamp that clamps the test object, and the test object is free Fall to the starting position to complete a test cycle. Only one object to be tested can be tested at a time, and the test efficiency i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N3/303G01M7/08
Inventor 刘贤琦
Owner SHANGHAI CHENXING ELECTRONICS SCI & TECH CO LTD