Inspection apparatus and method

A technology of inspection device and discriminant function, applied in measuring device, instrument, measuring ultrasonic/sonic/infrasonic wave, etc., can solve problems such as degradation of discriminant performance

Inactive Publication Date: 2009-08-05
ORMON CORP
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  • Summary
  • Abstract
  • Description
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Problems solved by technology

Moreover, when there are few learning samples, it is also possible that the learning samples are relatively sparse in places where the density is originally high, so there is a risk that the discriminative performance will drop significantly.

Method used

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  • Inspection apparatus and method
  • Inspection apparatus and method
  • Inspection apparatus and method

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Embodiment Construction

[0093] Hereinafter, one embodiment of the present invention will be described with reference to the drawings.

[0094] figure 2 It is an explanatory diagram showing an outline of the configuration of the inspection device 100 according to the present embodiment. figure 1 is a functional block diagram showing the configuration of the discriminant function determination unit 20 included in the inspection device 100 .

[0095] The inspection apparatus 100 of the present embodiment extracts feature quantities from the input measurement data of the inspection object. The inspection device 100 judges whether the sample is qualified or not through non-parametric discrimination based on the extracted feature quantity. And in particular, the inspection apparatus 100 has a discriminant function determination unit 20 . This discriminant function determination unit 20 has the following functions: (1) to determine whether the discriminant function used in the non-parametric one-class ...

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Abstract

The invention provides an inspection device and an inspection method. The problem is to determine the discriminant function so that the discriminant function used in the non-parametric class discrimination forms a single non-defective product area. As a solution, in the discriminant function determination unit (20) of the inspection device, the non-parametric class determination unit (26) determines whether the discriminant function used in the non-parametric class discrimination forms a single qualified product area. If there is not one good product area, the parameter setting unit (24) sets an area parameter so that the discriminant function forms a single good product area in the input space where samples are plotted, wherein the area parameter specifies the discriminant function and Specifies the region size of the basis functions on which the density function is based.

Description

technical field [0001] The present invention relates to an inspection device and an inspection method for extracting feature quantities from input measurement data of an inspection object, and judging the state of the inspection object based on the extracted feature quantities. Background technique [0002] Rotary equipment incorporating drive system components such as electric motors is widely used in automobiles and home appliances. For example, in an automobile, rotating equipment is installed everywhere in the engine, power steering, power seat, transmission, and the like. In addition, among home electric appliances, rotary devices are installed in various products such as refrigerators, air conditioners, and washing machines. Then, when these rotary devices are in operation, sound is generated due to the rotation of the motor or the like. [0003] The sound caused by rotation includes the sound that must be produced with normal operation, and the sound that is caused ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01H17/00G01M19/00G01M99/00
Inventor 糀谷和人田崎博中嶋宏伊藤星子
Owner ORMON CORP
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