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Active energy ray-curable resin composition and method for forming resist pattern

A technology of resin composition and activation energy, which is applied in the photoplate making process of patterned surface, semiconductor/solid-state device manufacturing, and photosensitive materials used in optomechanical equipment, etc., which can solve the problem of poor resolution of resist pattern and cost Increased height, increased etching burden, etc., to achieve significant effects and prevent vignetting

Inactive Publication Date: 2007-07-25
KANSAI PAINT CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, the method of mixing a pigment into the resist composition has problems in that the resolution of the resist pattern deteriorates, and when the resist film is a thin film, the anti-halation effect is insufficient.
In addition, the big problem with the method of forming the anti-reflection layer is that the burden of etching increases.
In addition, the method of using a negative-acting chemically amplified photosensitive composition requires heat treatment, so the cost becomes high and the process management is troublesome.

Method used

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  • Active energy ray-curable resin composition and method for forming resist pattern
  • Active energy ray-curable resin composition and method for forming resist pattern

Examples

Experimental program
Comparison scheme
Effect test

Synthetic example 1

[0059]

[0060]Acrylic resin (resin acid value 600mgKOH / g, styrene / acrylic acid = 20 / 80 weight ratio) was reacted with 125 parts of glycidyl methacrylate to obtain resin 1 (resin solid content 55% by weight, propylene glycol monomethyl ether organic Solvent, resin acid value 55mgKOH / g, weight average molecular weight is about 50,000).

Synthetic example 2

[0061]

[0062] 199 parts of triphenolmethane type epoxy resin with epoxy equivalent of 205 (g / eq) were dissolved in 370 parts of epichlorohydrin. Then, tetramethylammonium chloride was added, and an aqueous NaOH solution was further added dropwise to react at 70°C for 3 hours. After the reaction was completed, it was washed with water, and epichlorohydrin was distilled off under reduced pressure. Furthermore, the reaction product was dissolved in methyl isobutyl ketone, NaOH aqueous solution was added, and the reaction was carried out at 70° C. for 1 hour. After completion of the reaction, it was washed with water, and then methyl isobutyl ketone was distilled off to obtain 195 parts of epoxy resin (a) having an epoxy equivalent of 189 (g / eq).

[0063] 189 parts of epoxy resin (a) was dissolved in 68.5 parts of acrylic acid and carbitol acetate. Then, the reaction was carried out at 95°C in the presence of Mitokine and triphenylphosphine. When it is confirmed that the acid value...

Synthetic example 3

[0064]

[0065] 240 parts of cresol novolak type epoxy resin having an epoxy equivalent of 199 (g / eq) were dissolved in 370 parts of epichlorohydrin and dimethyl sulfoxide. Then, NaOH was added and reacted at 70°C for 3 hours. Then, unreacted epichlorohydrin and dimethyl sulfoxide were distilled off under reduced pressure, and the reaction product was further dissolved in methyl isobutyl ketone. Then, an aqueous NaOH solution was added, and the reaction was carried out at 70°C for 1 hour. After completion of the reaction, it was washed with water, and then methyl isobutyl ketone was distilled off to obtain 241 parts of epoxy resin (b) having an epoxy equivalent of 190 (g / eq).

[0066] Dissolve 190 parts of epoxy resin (b) in 68.5 parts of acrylic acid and carbitol acetate. Then, it was reacted at 95°C in the presence of mitol-hydroquinone and triphenylphosphine. When it is confirmed that the acid value is 1.0 (mgKOH / g) or less, 121.6 parts of hexahydrophthalic anhydride and carbi...

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Abstract

Disclosed are an active energy ray-curable resin composition, wherein when the active energy ray-curable resin composition is coated onto a substrate and made into a resist film with a predetermined thickness, a ratio (Y / X) of a quantity of a transmitted active energy ray (Y) after transmission through the resist film to a quantity of an initial active energy ray (X) on the surface of the resist film is 10% or less in a spectral sensitivity wavelength range of the resist film; and a method for forming a resist pattern by using this composition.

Description

Technical field [0001] The present invention relates to an active energy ray-curable resin composition and a method for forming a resist pattern using the resin composition. Background technique [0002] In the past, when a resist pattern was formed, the reflected light from the surface of the resist film base substrate produced halation, which hindered the shape of the resist pattern. Methods to solve this problem include, for example, the method of adding a pigment to the resist composition (see JP-A-47-38037 and JP-A-11-160860), and the method of forming an anti-reflective layer on the surface of the base substrate (see Japanese Patent Laid-Open No. 5-343314), a method of using a negative chemically amplified photosensitive composition (see Japanese Patent Laid-Open No. 2000-258904), wherein the composition contains an alkali-soluble resin, a compound that can generate acid upon irradiation with active rays, and The acid crosslinking crosslinking agent and the light absorber w...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G03F7/004G03F7/027G03F7/028G03F7/00H01L21/027
CPCG03F7/091G03F7/031G03F7/0388G03F7/0382
Inventor 长谷川刚也小岛大辅今井玄儿
Owner KANSAI PAINT CO LTD