Electronic components voltage-resisting test apparatus and method

Abstract

An apparatus for voltage withstanding of electronic elements, comprising a waveform generation unit, a power amplification unit, a transformer unit, a signal conditioning unit and a test module, wherein, the waveform generation unit is used for generating oscillation signals; the power amplification unit is used for amplifying the power of the oscillation signals to obtain power amplification signals; the transformer unit is used for changing the voltage of the power amplification signals to obtain the transformation signals; the signal conditioning unit is used for isolating reversal voltage signals in the transformation signals to obtain test signals; the test module is used for testing an element to be tested as per the test signals to obtain test data. A method for voltage withstanding of electronic elements is also provided.

Description

technical field [0001] The invention relates to an electronic component electrical parameter testing device and method, in particular to an electronic component withstand voltage testing device and method. Background technique [0002] With the development of science and technology, more and more electronic products are coming to the market. The stability of the electronic components used in electronic products, such as diodes, transistors and other transistors, has become an important measure of the durability of electronic products. Therefore, before the electronic products leave the factory, strict performance tests, especially withstand voltage tests, must be carried out on the electronic components used in them. [0003] As shown in FIG. 5 , at present, common electronic component withstand voltage testing equipment 500 mainly includes: a single-chip microcomputer 510 , a digital-to-analog converter 520 , a power amplifier circuit 530 and a transformer 540 . Wherein, ...

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Problems solved by technology

[0004] The above electronic component withstand voltage testing equipment 500, its test signal is the full-cycle voltage of a sine wave signal, including forward voltage and reverse voltage, and its reverse voltage will affect the duty cycle of the test signal, so as to test the accuracy of the electronic component make an impact

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