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Test equipment

A technology for testing equipment and equipment under test, applied in the field of connecting lines, can solve problems such as increasing development cost, lengthening development cycle, reducing test equipment versatility, etc., and achieves the effects of improving reliability, increasing versatility, and shortening development cycle.

Inactive Publication Date: 2008-11-26
上海福太隆汽车电子科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] This increases the development cost, lengthens the devel

Method used

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Embodiment Construction

[0010] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0011] As can be seen from Fig. 2: the present invention includes: N circuit boards; one or more of the N circuit boards corresponds to the required device under test; a motherboard is also included; the N circuit boards are inserted into the On the motherboard; the signals of each of the N circuit boards are connected to the output interface through the motherboard.

[0012] In the present invention, the signals of N circuit boards are connected to one output interface through one mother board, so the output interface devices and wiring harnesses on each circuit board in the original test equipment are omitted. In this way, the development cost is reduced, the development speed is improved, the test equipment has high versatility, and the reliability of the test equipment is also improved.

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Abstract

The invention relates to testing equipment consisting of a plurality of circuit boards and a mother board. One or more circuit boards of the circuit boards correspond to equipment that needs to be tested. The circuit boards insert in the mother board. Each circuit board is connected with an output interface through the mother board. The beneficial effect of the invention is that only one sire harness is required, thus greatly lowering development cost, shortening development cycle and improving the commonality and the reliability of the testing equipment.

Description

technical field [0001] The invention relates to a testing device, in particular to a connection line between the testing device and a device under test. Background technique [0002] It can be seen from Figure 1 that each circuit board in the test equipment needs a wire harness, and several wire harnesses are needed to connect to the device under test. [0003] This increases the development cost, lengthens the development cycle, and reduces the versatility of the test equipment. Contents of the invention [0004] The technical problem to be solved by the present invention is to provide a testing device, aiming at solving the above-mentioned problems. [0005] In order to solve the above technical problems, the present invention is realized through the following technical solutions: [0006] The present invention includes: N circuit boards; one or several of the N circuit boards correspond to the required equipment under test; a motherboard is also included; the N circui...

Claims

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Application Information

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IPC IPC(8): G01R31/00
Inventor 王文忠常海刘昌全文玉远
Owner 上海福太隆汽车电子科技有限公司