Pattern classification method
A test mode, training mode technology, applied in character and pattern recognition, instruments, computer parts, etc., can solve the problem of high uncertainty
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[0042] figure 1 An example of a two-dimensional feature space with two contours 10 , 12 representing data points 14 belonging to two different classes of training patterns is shown. In the example shown, the pattern of the feature space can be explicitly represented as an array with the coordinates of the corresponding data points 14 as array elements. For example, the collection of training patterns can be achieved by setting one or more sensors whose output is to be assigned to a different class for a situation whose classification is known. In the present example, the representation of the collected patterns produces two contours 10, 12 corresponding to a first classification and a second classification.
[0043] Once the training patterns have been collected, class membership probability functions are generated on this feature space. This can be achieved by various methods well documented in the literature. figure 2 is shown by using figure 1 The data shown and the pa...
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