Assembling and aligning device and method for thermal infrared spectrum imaging system

A technology of thermal infrared spectroscopy and imaging system, which is applied in the field of optical instrument installation and calibration technology, can solve problems such as installation and calibration difficulties, and achieve the effect of shortening the installation and calibration cycle and strong repeatability

Active Publication Date: 2009-09-02
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

At room temperature, the radiation of objects is mainly concentrated in the thermal infrared band, and the radiation of the lens barrel and other objects in the system will form considerable

Method used

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  • Assembling and aligning device and method for thermal infrared spectrum imaging system

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[0039] According to figure 1 Give a better embodiment of the present invention and elaborate it in detail:

[0040] The focal length of the telescope objective, collimator and converging lens of the spectral imaging system to be installed and adjusted is 40mm, using a plane reflection blazed grating, and the grating incident angle θ of the center working wavelength 2 Is 41.8°, the diffraction angle (θ 1 -θ 2 ) Is 48.2°, and the optical path between the telescope lens and the rear converging lens forms θ 1 Is 90°. The collimator used is a self-developed instrument with a focal length of 4000mm. The detector is an area array detector with a pixel size of 0.03mm. The slit-to-slit width and interval are 4000×0.03 / 40=3mm. The black body model is HFY-300A made by Shanghai Fuyuan Company. The black body is on the collimator stage, with only a slit pair in the front, and the slit pair is at the focal plane of the collimator. According to the method of the present invention, the relative p...

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Abstract

The invention discloses an assembling and aligning method for a thermal infrared spectrum imaging system based on a plane-array detector. As the surface of a lens plated with a thermal infrared anti-reflection film has stronger reflection on visible light, the invention provides the assembling and aligning method realized by means of auxiliary objects such as a black body, a slit pair, an auxiliary plane mirror, a precision rotary table, an internal focusing telescope, a collimator tube and the like. The method comprises: placing the black body and the slit pair on a focal plane of the collimator tube to simulate radiation at infinity, and observing the definition of an image of the slit pair on a photosensitive surface of the detector to determine relative positions of lenses and elements. The assembling and aligning method can effectively solve the problem that the thermal infrared spectrum imaging system cannot carry out optical assembling and aligning through visual measurement or other common optical instruments, shortens the assembling and aligning period of the system, and has strong repeatability.

Description

technical field [0001] The invention relates to an optical instrument calibration process technology, in particular to a calibration device and calibration method for a long-wave infrared spectral imaging system, which is also suitable for system calibration of visible near-infrared or mid-wave infrared spectral imaging systems. Background technique [0002] The spectral imaging system can obtain image information and pixel spectral information at the same time, and can directly analyze the material composition of the target from the acquired remote sensing data, so as to effectively identify ground objects, distinguish targets, and expose military camouflage. At present, research on spectral imaging systems in the visible and near-infrared bands is quite common at home and abroad, but research on thermal infrared bands, especially thermal infrared bands above 8 microns, and finely divided spectral imaging systems is still relatively small. Compared with foreign countries, o...

Claims

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Application Information

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IPC IPC(8): G01J5/10
Inventor 袁立银林颖王建宇徐卫明舒嵘
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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