Assembling and aligning device and method for thermal infrared spectrum imaging system
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
- Publication Date
- 2009-09-02
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Figure 1
Abstract
Description
technical field
[0001] The invention relates to an optical instrument calibration process technology, in particular to a calibration device and calibration method for a long-wave infrared spectral imaging system, which is also suitable for system calibration of visible near-infrared or mid-wave infrared spectral imaging systems. Background technique
[0002] The spectral imaging system can obtain image information and pixel spectral information at the same time, and can directly analyze the material composition of the target from the acquired remote sensing data, so as to effectively identify ground objects, distinguish targets, and expose military camouflage. At present, research on spectral imaging systems in the visible and near-infrared bands is quite common at home and abroad, but research on thermal infrared bands, especially thermal infrared bands above 8 microns, and finely divided spectral imaging systems is still relatively small. Compared with foreign countries, o...