68 results about "Slit width" patented technology

This invention relates to an in-situ detection system for a rotating microliquid film reactor (MFR) for monitoring the nucleation behavior of nanomaterials. The reactor comprises a rotor and a stator, with a stator base angle of 70-85°, a rotational speed of 500-5000 rpm, and a slit width of 10-500 μm to ensure that fluid passing through the slit does not undergo backmixing and to create a strong shear field. A micro-negative pressure sampler is fabricated to capture nucleating particles within the high-speed shear field and bring them into the visible observation area. A high-speed camera and microscope objective are connected in situ, thereby acquiring instantaneous images of the nucleation process at the nanoscale and capturing the transient evolution behavior of crystal nuclei. The construction of this rotating MFR in-situ detection system solves the problems of poor micro-mixing effects and uncontrollable nucleation and growth in traditional stirred tank reactors, leading to poor quality in large-scale preparations, and the inability to observe phase transitions and instantaneous nucleation processes in a closed reactor. The obtained hydrotalcite nucleation results enrich non-classical nucleation theories and provide guidance for the large-scale preparation of nanomaterials.

The technology provides a method and apparatus for standardizing spectral resolution across multiple spectrometers using custom input slit dimensions. A plate with a slit may be replaced to provide various slit widths to obtain desired spectrometer resolution. Alternatively, the plate may include an adjustable slit width that is mechanically adjusted over a desired range of values. The slit width may be adjusted by discrete increment amounts determined based on an end application. A resolution of a tunable spectrometer may be calibrated to match a reference spectrometer by customizing a slit width value. The technology enhances the accuracy of spectral classification algorithms by minimizing variability of Raman spectra introduced by spectrometer component differences in lenses, gratings, and detectors, for example.

A hyperspectral imaging device includes an optical channel arranged to focus light at a first image plane. A spectrometer includes a slit formed at the first image plane to allow a slit-shaped portion of the light pass through. A dispersive element receives light from the slit and spectrally disperses it along a direction perpendicular to a width of the slit. A focusing lens focuses the spectrally dispersed light at a second image plane such that the spectral dispersion is imaged along a first axis thereof, and a spatial image of the slit width is imaged along a second axis for detection by a sensor. A sliding lens group between the optical channel and the first image plane moves to direct the incident light, scanning the entire image over the slit such that multiple frames acquired by the sensor each correspond to a horizontal line of the image.

The utility model relates to the technical field of optical instruments, in particular to a two-dimensional adjustable optical slit device which comprises a base, two containing cavities are symmetrically formed in the base, and a partition plate is formed between the two containing cavities. A blade is arranged in each containing cavity, a rotating shaft transversely penetrates through the blades, positioning columns are arranged at the two ends of the rotating shaft, sliding grooves are formed in the front inner wall and the rear inner wall of each containing cavity, and the positioning columns are inserted into the sliding grooves and slide in the sliding grooves. The end, extending out of the sliding groove, of the positioning column is fixedly connected with a supporting plate, the supporting plate is connected with a sliding plate arranged on the base in a sliding mode, and the sliding plate is provided with a spiral micrometer head. The positioning column moves along the sliding groove to achieve large-range position adjustment, the spiral micrometer head is responsible for high-precision slit width control, transverse and tangential two-dimensional adjustment is achieved, efficiency and precision are both considered, the slit width and the center position can be simply and accurately adjusted, and the structure is simple and practical.

A hyperspectral imaging device includes an optical channel arranged to focus light at a first image plane. A spectrometer includes a slit formed at the first image plane to allow a slit-shaped portion of the light pass through. A dispersive element receives light from the slit and spectrally disperses it along a direction perpendicular to a width of the slit. A focusing lens focuses the spectrally dispersed light at a second image plane such that the spectral dispersion is imaged along a first axis thereof, and a spatial image of the slit width is imaged along a second axis for detection by a sensor. A sliding lens group between the optical channel and the first image plane moves to direct the incident light, scanning the entire image over the slit such that multiple frames acquired by the sensor each correspond to a horizontal line of the image.

This application provides a method for measuring the cross-sectional shape of photoresist. The method includes: Step S1: forming a photoresist layer on a substrate and performing a photolithography process; Step S2: measuring the patterned photoresist layer, determining whether the photolithography process was successful based on the measurement results; if not, removing the patterned photoresist layer and returning to Step S1; if yes, proceeding to Step S3: selecting a measurement area on the patterned photoresist layer, the measurement area having a repeating pattern to serve as a grating; Step S4: measuring the diffraction intensity of zero-order and first-order light at multiple wavelengths λ using a diffraction-based overlay error measurement method; Step S5: calculating the equivalent slit width a of the grating; Step S6: obtaining the cross-sectional shape of the patterned photoresist layer. This application utilizes the principle of grating diffraction, the diffraction-based overlay measurement technology, and mathematical calculations of diffraction intensity to obtain the cross-sectional shape information of the photoresist, thus eliminating the need for slicing and saving time and manpower resources.

The invention provides a pole piece slitting method, a controller and a pole piece slitting system. The pole piece slitting method comprises the following steps: firstly, acquiring width information of a wide pole piece to be slit at a first detection position so as to determine a standard slitting position corresponding to each slitting point based on the acquired width information and a preset slitting width number; obtaining the current position information of the wide pole piece to be slit at the second detection position, comparing the current position information with the preset position information, and determining the offset direction and offset of the wide pole piece to be slit in the moving process; and finally, the standard slitting position is adjusted in real time on the basis of the deviation direction and the deviation amount of the wide pole piece to be slit, so that when the wide pole piece to be slit deviates, the wide pole piece to be slit can still be precisely slit into a plurality of narrow pole pieces on the basis of the adjusted slitting position, the slitting precision of the laser slitting device is effectively improved, and the production efficiency is improved. The width tolerance of a plurality of narrow pole pieces is reduced, and the high-precision requirement required in the lithium battery manufacturing process is met.

The invention provides a spectrograph resolution control method and module and an in-situ monitoring system, and relates to the technical field of semiconductor detection.The spectrograph resolution control method comprises the steps that spectral data output by a spectrograph are obtained, the central wavelength value of the spectrograph is calculated, a preset relation model is inquired according to the central wavelength value and a preset target resolution, and the corresponding target slit width is obtained; and an adjustment instruction is sent to the motor, so that the motor adjusts the slit to the target slit width in the intermittent period when the spectrograph scans different wavebands, and then the current resolution of the spectrograph is adjusted to the target resolution. According to the application, the corresponding target slit width can be obtained according to the spectral data measured in real time, and the motor is driven to adjust the slit to the target slit width, so that the current resolution is adjusted, the resolution of the spectrometer in the epitaxial growth process is maintained at the target resolution, the measurement precision is improved, and the performance of a semiconductor device is stabilized.

The utility model relates to a visible light-based optical fiber slit width detection device, which belongs to the field of detection equipment, and comprises a semiconductor laser, the semiconductor laser emits visible light to enter a convex lens, and light beams are converged through the convex lens; the converged light beams enter a half-wave plate and a polarizing beam splitter to realize separation of P light and S light and light intensity adjustment; the adjusted light beam enters a first total reflective mirror and a second total reflective mirror and enters an optical attenuator through the first total reflective mirror and the second total reflective mirror, the light beam with attenuated light intensity enters a first optical fiber collimator, and the first optical fiber collimator is connected to an optical fiber coil to realize coupling of spatial light to optical fibers; the optical fiber coil is sequentially connected with a second optical fiber collimator, a digital camera and a computer; the whole device adopts common and cheap optical elements, so that the detection cost is reduced.

The invention discloses a comb-shaped collimator which comprises a collimator main body which comprises an inner edge and an outer edge, multiple layers of collimation slits are arranged on the collimator main body in the height direction, every two adjacent layers of collimation slits are separated, each layer of collimation slit comprises multiple sub-collimation slits arranged in the transverse direction, and each sub-collimation slit extends from the inner edge to the outer edge; wherein the slit width of the sub collimation slit of each layer of collimation slit of the plurality of layers of collimation slits is different from the slit widths of the sub collimation slits of other layers of collimation slits. The invention further provides a ray detection device comprising the comb-shaped collimator, through the design of the comb-shaped collimator with multi-stage slit widths, the switching of collimation slits with different slit widths can be realized, so that the equivalent width of a detection channel of the ray detection device is adjusted, the adjustment of the spatial resolution of a scanned image of an industrial CT system is further realized, and the detection accuracy of the ray detection device is improved. And the application range of the industrial CT system is expanded.

The utility model belongs to the technical field of adjustable slits, and discloses an adjustable slit used in an optical path, which comprises a slit shell, a slit cover is arranged on one side of the slit shell, an adjusting rod is inserted in the outer side of the slit shell in a threaded manner, a handle is fixedly arranged at one end of the adjusting rod, a baffle is sleeved on the outer side of one end of the adjusting rod, and a light source is arranged on the baffle. Second-level positioning blocks are fixedly arranged on the inner walls of the two sides of the slit shell, first-level positioning blocks are fixedly arranged on the inner side of the slit shell, the inner sides of the first-level positioning blocks and the inner sides of the second-level positioning blocks are slidably attached to a baffle, a limiting groove is formed in the inner side of the baffle, a limiting plate is fixedly arranged at one end of the adjusting rod, and the outer side of the limiting plate is attached to the limiting groove. According to the utility model, through the baffle plate and the adjusting rod, the effective width of the light-passing slit can be changed by adjusting the position of the baffle plate so as to meet the adjusting requirements of different light paths on the width of the slit, and the structure adaptability is good, so that the light-passing slit can be well butted to a light path system.

The invention relates to the technical field of slit lamps, in particular to a slit light adjusting device and a motor auxiliary control method for slit width adjustment. The device comprises an illumination angle adjusting mechanism and a crack width adjusting mechanism. The crack width adjusting mechanism comprises a rotary knob, a transmission shaft, a rotary knob end gear, an encoder gear, an encoder and a crack opening and closing executing mechanism. The knob drives the knob end gear to rotate through the transmission shaft, the encoder gear is meshed with the knob end gear and installed on the encoder input shaft, a shared transmission path is formed, the knob rotates to be synchronously transmitted to the encoder, and signals of the encoder drive the opening and closing motor. The spring assembly is arranged below the encoder and pushes the encoder gear upwards to eliminate the meshing clearance. According to the device, the problem that a traditional manual structure lacks electric control cooperation is solved, through the common path and spring design, idle stroke is avoided, instant response and consistent hand feeling of bidirectional adjustment are ensured, and motor assistance, remote control and automatic calibration are supported.

The invention relates to a light source adjusting device and method, a storage medium and a program product. The device comprises a first grating (L1) used for converting a light source into polarized light; the second grating (L2) is arranged opposite to the first grating (L1) and is used for adjusting the polarized light to generate interference after passing through the second grating (L2) based on the slit width of the second grating (L2) and outputting the polarized light; wherein the slit width of the second grating (L2) is adjustable. According to the method, the light source of the device can be adjusted by adjusting the angle of the slit width of the grating, and the light source adjusting efficiency and the light source data precision can be improved; compared with an existing mode that a mechanical structure is applied to adjust the light distribution angle or position of the light initially irradiated by the light source, the device in the scheme is low in structural space requirement and low in maintenance cost, and stability is improved.

A spectroscopic analysis system includes: an operation panel configured to receive an input of at least one of an upper limit value of a measurement period of a spectroscopic analysis spectrum or a lower limit value of measurement accuracy as a user setting condition related to measurement of the spectroscopic analysis spectrum of a sample; and a control unit configured to derive a predetermined recommended measurement condition that satisfies the user setting condition and cause a display unit to display the recommended measurement condition, in which the recommended measurement condition is at least one of a wavelength range of light to be used for measurement of the spectroscopic analysis spectrum, a sampling interval of a wavelength of the light, a slit width of a diffraction grating of a spectroscope that disperses the light, or a sweep speed of the wavelength of the light.

The invention belongs to the field of plasma physics and spectroscopy diagnosis, and relates to a multi-grating space notch filtering spectrometer which comprises a slit, a semi-reflecting and semi-transmitting mirror, a lens, gratings, a notch reflector, a displacement platform, a total reflector and a detector. The gap width is adjusted through the displacement platform, continuous adjustment of the notch filtering range can be achieved, a user can freely select to filter out a single wavelength or a section of spectrum, and the device is suitable for different application scenes. The gap position accurately corresponds to the spectral space distribution after light splitting, and the filtering pertinence is very strong. Compared with a three-grating spectrometer, only two three-gratings are needed, the gratings are high-cost elements, the manufacturing cost is lower, meanwhile, the beam combining precision can be kept, and the three-grating spectrometer is compact in structure, small in size and easy to build. According to the multi-grating space notch filtering spectrometer, interference signals are accurately filtered out, the detector only receives effective spectrums, the signal-to-noise ratio is remarkably increased, and the multi-grating space notch filtering spectrometer is very beneficial to the field of weak signal detection.

The present application provides a method and a processing system for processing a silicon carbide ingot, belonging to the technical field of silicon carbide ingot processing, and solving the problem that it is difficult to process a silicon carbide ingot in the prior art. The present application includes the following steps: obtaining the roughness of the near-light surface of the ingot, where the near-light surface of the ingot is the surface facing the laser emission; screening out at least a first-level rough surface and a second-level rough surface according to the roughness of the near-light surface of the ingot, and the roughness Ra1 of the first-level rough surface is greater than the roughness Ra2 of the second-level rough surface; based on different rough surfaces, implementing a processing strategy, where the processing strategy includes: scanning the target depth area A1 of the first-level rough surface with an α1 beam to form a first modified area; scanning the target depth area A2 of the second-level rough surface with an α2 beam to form a second modified area; wherein, the pulse energy of the α1 beam is configured to be greater than the pulse energy of the α2 beam so that the slit width of the first modified area is substantially the same as the slit width of the second modified area.

To provide a simple focal spot size measuring method satisfying requirements of the fifth edition of IEC 60336 by using a two-dimensional digital X-ray sensor and reducing the number of data used for noise reduction.SOLUTION: An X-ray tube focal spot size measuring device comprises a power supply unit for driving an X-ray tube, the X-ray tube, the source of X-rays, a slit camera with a continuously uniform slit width, and a two-dimensional digital X-ray sensor. An X-ray tube focal spot size measuring method measures a focal spot size of the X-ray tube by the steps of: averaging signals having a line spread function corresponding to intensities of X-rays of a plurality of lines different in the longitudinal direction of the slit by using the X-ray tube focal spot size measuring device to calculate an averaged signal; and calculating the focal spot size on the basis of the width of two points having a prescribed ratio to a maximum value of an averaged signal having the line spread function.SELECTED DRAWING: Figure 17

The present invention discloses a non-contact adjustable micro-nano bubble generator. In the stator of the present invention, an adjustable watertight slit mechanism is provided, and micro-nano bubbles are generated by using the slits in the adjustable watertight slit mechanism. Moreover, by adjusting various means or combinations thereof such as the distance between the height adjustment block and the rotor in the adjustable watertight slit mechanism, adjusting the distance between the horizontal adjustment blocks 9 (i.e., the slit width), and adjusting the slit position, etc., the size and generation amount of micro-nano bubbles can be adjusted in multiple ways, having a wider micro-nano bubble adjustment range.

The invention relates to a coupling parameterization design method and system of a trailing edge double-slit and turbulent flow structure, and belongs to the field of turbine blade computer aided design. The method comprises the steps that on the basis of pressure side and suction side molded lines of a trailing edge cavity, an S1 flow surface technology is adopted for conducting parametric modeling on a half-crack structure and a full-crack structure; determining the distribution rule of the double slits along the blade height through blade height dimensionless processing; and spoiler column structures are arranged on the unfolding surfaces of the trailing edge cavity and the laminate cavity, so that a double-slit trailing edge system coupled with spoiler columns is formed. The system realizes automatic modeling of the process through a layering module. A laminate cavity is adopted as an air supply source, and a full-split-seam and half-split-seam coupled double-split-seam form is constructed: air is supplied to the full-split seam by the laminate cavity, and air is supplied to the half-split seam by the trailing edge cavity. The laminated plate cavity extends to the rear part of the suction side throat part in a breakthrough manner, so that the area is effectively cooled, the air film covering effect is enhanced through the turbulent flow columns, and the excellent cooling performance can still be maintained even if the slit width of the full-split slit is relatively small.

The invention provides a slit type lithium niobate electro-optical modulator. According to the slit-type lithium niobate electro-optical modulator, the full-coverage silicon dioxide upper cover layer is designed and the thickness of the full-coverage silicon dioxide upper cover layer is regulated and controlled, so that the light field leakage loss in the optical waveguide is reduced, and meanwhile, the position is designed between the lithium niobate layer and the metal electrode structure layer, so that the absorption loss of metal is effectively reduced; secondly, the slit width and the slit thickness of the slit type optical waveguide structure are optimized, the effective mode area is reduced, and the transmission loss is further reduced; through the design of the special electric field regulation and control layer, the electric field is regulated and controlled while the light field leakage is reduced to a certain extent, so that the electric field intensity of the waveguide center is enhanced, and the loss reduction and the high modulation efficiency are finally realized; in the electro-optical modulator, structural optimization is carried out in three important aspects of microwave loss, microwave refractive index matching and impedance matching, and finally, low-loss, high-efficiency and large-bandwidth design is realized.

A Young modulus measuring instrument based on a single-slit diffraction and buoyancy dynamic adjustment tensile method comprises a diffraction generating device and a receiving device, the diffraction generating device comprises a base 13, a stand column 1 vertically installed on the base 13, an upper cross beam 2 installed on the stand column 1 in a sliding mode, and a single-slit platform 7 located in the middle of the stand column 1; the semiconductor laser 8 is fixed on the diffraction single-slit platform 7, and the digital display tension meter 9 is connected with the diffraction single-slit platform. The light diffraction receiving device comprises a diffraction observation screen 14 and a diffraction observation screen base 16. The diffraction observation screen is placed on a laser light path away from the single slit by one meter. A buoyancy dynamic adjusting device is designed at the lower end of a to-be-measured wire 4 to indirectly measure the tensile force borne by the to-be-measured wire, the to-be-measured wire drives a single-slit lower knife edge to move after the length of the to-be-measured wire is expanded and contracted, the width of a single slit is changed, a 1: 10 lever 6 is connected with a single-slit upper knife edge and a digital microscope head 5, and the upper knife edge can move up and down under the action of the 1: 10 lever 6. And the digital display micrometer head 5 can accurately read the change of the slit width. The device is based on a single slit diffraction principle and buoyancy dynamic bidirectional stepless adjustment tension, and has the advantages of simple process, low manufacturing cost, small error and the like.

The utility model belongs to the technical field of grating inscribing, and discloses a light-transmitting slit device and grating inscribing equipment. The light-transmitting slit device comprises a slit base, two sliding blocks, two driving assemblies and a supporting assembly. The slit base is provided with a slit hole, and the light beam can pass through the slit hole. The two sliding blocks are connected to the slit base in a sliding mode in the first direction, the two sliding blocks can shield the slit hole, and a light-transmitting slit is formed between the two sliding blocks. The driving assemblies are in one-to-one correspondence with the sliding blocks, the driving assemblies are connected to the slit base, and the driving assemblies can drive the sliding blocks to slide in the first direction. The supporting assembly is connected to the slit base, and the supporting assembly can fix the slit base to the optical platform. The two sliding blocks are driven by the driving assembly to move in the direction close to each other, and the width of the light-transmitting slit is reduced. The driving assembly drives the two sliding blocks to move in the direction away from each other, the width of the light-transmitting slit is increased, and therefore adjustment of the width of the light-transmitting slit is achieved.

The present invention discloses a high-precision rotary blade slit device, which comprises a vacuum box and at least one set of slit structures. Corresponding two side walls of the vacuum box are respectively provided with a light inlet and a light outlet; the slit structure includes a rotating mechanism and a blade. One ends of two rotating mechanisms are arranged outside the vacuum box, and the output end of each rotating mechanism extends into the vacuum box and is connected with the blade. The two blades are symmetrically arranged, and the gap between the two blades is the slit width H. The rotating mechanism is driven to drive the blade to rotate so as to change the size of the slit width. The advantages of the present invention are that, compared with the existing translational movement of the blade, the rotation of the blade by using the rotating mechanism in the present invention can greatly improve the precision of the slit device, meet the requirements of high-precision slits, and enable the slit device to be widely applied to high-precision optical instruments.

The invention discloses a continuous high-precision composite slitting all-in-one machine, and relates to the technical field of composite film processing, the continuous high-precision composite slitting all-in-one machine comprises an L-shaped base plate, a slitting assembly, a T-shaped frame, a first electric telescopic rod and a mounting column, the vertical surface of the base plate is rotatably provided with an air expansion winding shaft and a pair of air expansion unwinding shafts, and the continuous high-precision composite slitting all-in-one machine further comprises a cutting assembly, a T-shaped frame, a first electric telescopic rod and a mounting column; the slitting width of the slitting assembly can be adjusted, the slitting assembly comprises a pair of guide transverse shafts fixed to one side of the base plate, and a plurality of slitting units are installed on the pair of guide transverse shafts in a sliding mode. A sleeve block is driven by a first electric telescopic rod to move, a conductive clamp at the tail end of an L-shaped transmission rod is driven to slide along a spiral resistance wire, resistance value changes are fed back to a controller in real time, a plurality of slitting units are linked with a cross supporting rod to synchronously slide on a guide transverse shaft, and continuous and accurate adjustment of the slitting width is achieved; meanwhile, when the slitting width of the composite film is reduced, the conductive clamp moves to reduce resistance, the power of a cold pressing roller is improved, the binding force of the composite film is strengthened, and slitting warped edges are reduced.

A digital fountain pen includes a nib with two tines made of a flexible material that defines a slit, wherein its slit width varies according to the pressure applied to the nib and / or the orientation of the digital fountain pen relative to a writing surface. The digital fountain pen also includes a sensor module configured to measure the variable slit width, an orientation detection module configured to determine the position and tilt of the pen relative to the writing surface, and a communication module configured to transmit the slit width data and / or the orientation data to a connected computing device. The computing device utilizes the slit width data and the orientation data to dynamically control an amount of digital ink dispensed onto a digital paper, thereby simulating the writing experience and ink output of a stationery fountain pen.

A hyperspectral imaging device includes an optical channel arranged to focus light at a first image plane. A spectrometer includes a slit formed at the first image plane to allow a slit-shaped portion of the light pass through. A dispersive element receives light from the slit and spectrally disperses it along a direction perpendicular to a width of the slit. A focusing lens focuses the spectrally dispersed light at a second image plane such that the spectral dispersion is imaged along a first axis thereof, and a spatial image of the slit width is imaged along a second axis for detection by a sensor. A sliding lens group between the optical channel and the first image plane moves to direct the incident light, scanning the entire image over the slit such that multiple frames acquired by the sensor each correspond to a horizontal line of the image.

This application relates to the field of wave energy simulation technology and discloses a simulation method and system for dual-mode frequency tuning of oscillating water columns in a double-slit caisson. The method includes: establishing a two-degree-of-freedom dynamic equation system based on the displacements of the water columns in the front and rear cavities, using the slit transmission coefficient as a parameter to obtain the coupling stiffness; substituting the coupling stiffness into the eigenvalue equation to decompose the oscillation modes of the two cavities to obtain the mode transformation matrix and mode amplitude ratio; performing convolution integration on the mode amplitude ratio and the wave power spectrum of the target sea area to obtain the first-order mode weight and second-order mode weight; using a preset target first-order mode weight as the outer convergence target and a preset target natural frequency as the inner convergence constraint to perform a double-layer nested iterative solution on the slit transmission coefficient and the rear cavity volume to obtain the optimal slit width and the optimal rear cavity volume. This application solves the problem of unobservable and undesignable energy contribution ratios of each mode in existing technologies, leading to spectral mismatch.

An extrusion film-forming apparatus includes: a die that extrudes a molding material from a slit-shaped extrusion outlet; a die lip drive mechanism that changes a slit width of the extrusion outlet; and a control device that controls the die lip drive mechanism, in which during the extrusion of the molding material, the control device controls the die lip drive mechanism to temporarily decrease the slit width of the extrusion outlet for cutting the extruded molding material.

The application discloses a kind of width quadratic gradient light cathode design methods applied to stripe transmission grating spectrometer, comprising the following steps: step S1: with the center of light cathode base as origin (0,0) establishes rectangular coordinate system, light cathode slit length direction is defined as x-axis direction, and light cathode slit width direction is defined as y-axis direction;Step S2: light cathode slit edge coordinates comply with quadratic function and, step S3: establish zero-level center x-axis coordinate of silk.This application has the beneficial effects that: by using width quadratic gradient light cathode design, the signal intensity distribution of X-ray streak camera light cathode can be controlled, the signal intensity difference between high-energy region and low-energy region in transmission grating dispersion spectrum is reduced, and the problem of high dynamic range requirement for X-ray streak camera is solved.

A hyperspectral imaging system includes an optical channel arranged to focus light at a first image plane. A spectrometer includes a slit formed at the first image plane to allow a portion of the light to pass. A dispersive element receives light from the slit and spectrally disperses it along a direction perpendicular to a width of the slit. A focusing lens focuses the spectrally dispersed light at a second image plane such that the spectral dispersion is imaged along a first axis of the second image plane, and a spatial image of the slit width is imaged along a second axis. A sensor at the second image plane detects the spectrally dispersed light. A rotating prism is located distally to the slit and rotates, thereby rotating the image at the first imaging plane so that the portion of the image transmitted into the spectrometer varies.