Test scheduling system and test scheduling method

A technology for scheduling and testing parameters, which is applied in the field of test scheduling system that automatically optimizes the download process of test parameters, and can solve the problems of reduced test performance of test parameters for download times and download time, test parameters that cannot be downloaded to memory, etc.

Active Publication Date: 2010-03-10
KING YUAN ELECTRONICS
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Problems solved by technology

[0009] The purpose of the present invention is to overcome the defects existing in the existing test scheduling system and method, and provide a new test scheduling system and method. The technical problem to be solved is to make it solve the conventional test machine The problem that the test parameters cannot be downloaded to the memory caused by insufficient capacity, or the problem that the test parameters cannot be downloaded with the minimum download times and download time due to repeated downloads of the same test parameters, leads to the problem that the test performance is reduced, which is more suitable for practical use

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[0067] In order to further explain the technical means and functions adopted by the present invention to achieve the intended invention purpose, the following will describe the specific implementation, methods, steps, Features and their functions are described in detail below.

[0068] Some embodiments of the invention are described in detail below. However, the invention can be broadly practiced in other embodiments than this detailed description. That is, the scope of the present invention is not limited by the presented embodiments, but by the appended claims of the present invention. Secondly, when each element or structure in the illustrations of the embodiments of the present invention is described as a single element or structure, it should not be regarded as a limited cognition, that is, when the following description does not particularly emphasize the limitation on the number of the present invention The spirit and scope of application of the invention can be exten...

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Abstract

The invention relates to a test scheduling system and a test scheduling method, in particular to a test scheduling system and a test scheduling method for automatically optimized testing a parameter download process in a testing process. The test scheduling system and the test scheduling method calculate a weight value of each testing parameter through a weight unit, and establish an optimized testing parameter download process by a mode that the priority for downloading the testing parameters is given to larger weight value, so that the required testing parameters can be downloaded in the minimum downloading frequencies and time of the testing parameters to improve the testing efficiency.

Description

technical field [0001] The present invention relates to a test scheduling system and method, in particular to a test scheduling system and method for automatically optimizing the test parameter download process in the test process. Background technique [0002] After the electronic components are manufactured, they usually need to go through a circuit probe test, which is used to distinguish the good and the bad of the chips before packaging, confirm the quality of the chips for packaging, and avoid packaging the chips with poor quality. Unnecessary waste; and a final test (final test) is required after packaging to ensure that the chip is not damaged during the packaging process and that the chip still meets the specifications after packaging. [0003] However, regardless of the above-mentioned test, a test pattern (pattern) needs to be established, and according to this test pattern, it is determined who the signal is transmitted to, when it is transmitted, and the duratio...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
Inventor 梁文山陈福泰
Owner KING YUAN ELECTRONICS
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