Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Absolute non-interfering precision measuring method facing ultra-large spatial complex curved surface

A technology of precision measurement and complex curved surface, applied in the field of precision measurement, to achieve the effect of absolute non-interference precision measurement and free measurement method

Active Publication Date: 2010-05-12
ISVISION (TIANJIN) TECH CO LTD
View PDF0 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to solve the technical problems existing in the known technology, the present invention provides an absolutely non-interference precision measurement method for super-large space complex curved surfaces. The method adopts close-range photogrammetry method to realize super-large space complex curved surfaces without using coding marks. The measurement of the measured object does not require any physical marks on the surface of the measured object, and does not cause the slightest interference to the surface morphology of the measured object

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Absolute non-interfering precision measuring method facing ultra-large spatial complex curved surface
  • Absolute non-interfering precision measuring method facing ultra-large spatial complex curved surface

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] In order to further understand the invention content, characteristics and effects of the present invention, the following examples are given, and detailed descriptions are as follows in conjunction with the accompanying drawings:

[0014] see figure 1 , the present invention is an absolute non-interference precision measurement method for ultra-large spatially complex curved surfaces, the steps of which are as follows:

[0015] 1) Pre-calibrate the precise spatial three-dimensional coordinates of the measurement camera control point 6 on the measurement camera 2 in the measurement camera coordinate system; plan multiple global control point areas 9-1, 9-2, ... on the surface of the measured object;

[0016] 2) Set directional cameras 1, the number of directional cameras 1 should be determined according to the measurement area and shape of the measured object. Fixed directional camera 1 does not move, if the number of directional cameras is more than 1, calibrate the sp...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an absolute non-interfering precision measuring method facing ultra-large spatial complex curved surface. In the invention, an optical project method is utilized to set global control point and measuring point; the directed camera combined control point technology is utilized to realize the initial orientation of the measuring camera under each measuring station; the global control point is utilized to realize the splicing of each measuring point region and the measuring point is utilized to serve as public point to realize the splicing of global control point region. The invention solves the detection problem of the realization of ultra-large spatial curved surface by adopting the close-range photogrammetry method in the case of not utilizing coded marking; and no physical marking needs to be set on the surface of the detected object, and the surface appearance of the detected object is not slightly interfered.

Description

technical field [0001] The invention relates to a precision measurement method, in particular to an absolute non-interference precision measurement method for super-large spatial complex curved surfaces. Background technique [0002] The measurement of complex curved surfaces (with huge differences in local normal directions) in a super-large space (ranging from tens of meters to tens of meters) is a common and urgent problem in the field of super-large equipment manufacturing such as aerospace and shipbuilding. This type of measurement problem faces more complex technical problems than conventional size measurement, which are highlighted in the following two aspects: First, it is necessary to take into account both the measurement range and measurement accuracy, and achieve submillimeter-level high precision within a measurement range of tens of meters The measurement is quite difficult; the second is the high complexity of the measured surface, and most traditional measure...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B11/24
Inventor 邾继贵吴斌郭磊邹剑林嘉睿
Owner ISVISION (TIANJIN) TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com