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Absolute non-interfering precision measuring method facing ultra-large spatial complex curved surface

A precision measurement and complex surface technology, applied in the field of precision measurement, to achieve the effect of absolute interference-free precision measurement and free measurement methods

Inactive Publication Date: 2011-05-25
ISVISION (TIANJIN) TECH CO LTD
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Problems solved by technology

[0005] In order to solve the technical problems existing in the known technology, the present invention provides an absolutely non-interference precision measurement method for super-large space complex curved surfaces. The method adopts close-range photogrammetry method to realize super-large space complex curved surfaces without using coding marks. The measurement of the measured object does not require any physical marks on the surface of the measured object, and does not cause the slightest interference to the surface morphology of the measured object

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  • Absolute non-interfering precision measuring method facing ultra-large spatial complex curved surface
  • Absolute non-interfering precision measuring method facing ultra-large spatial complex curved surface

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[0013] In order to further understand the invention content, characteristics and effects of the present invention, the following examples are given, and detailed descriptions are as follows in conjunction with the accompanying drawings:

[0014] see figure 1 , the present invention is an absolute non-interference precision measurement method for ultra-large spatially complex curved surfaces, the steps of which are as follows:

[0015] 1) Pre-calibrate the precise spatial three-dimensional coordinates of the measurement camera control point 6 on the measurement camera 2 in the measurement camera coordinate system; plan multiple global control point areas 9-1, 9-2, ... on the surface of the measured object;

[0016] 2) Set directional cameras 1, the number of directional cameras 1 should be determined according to the measurement area and shape of the measured object. Fixed directional camera 1 does not move, if the number of directional cameras is more than 1, calibrate the sp...

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Abstract

The invention discloses an absolute non-interfering precision measuring method facing ultra-large spatial complex curved surface. In the invention, an optical project method is utilized to set global control point and measuring point; the directed camera combined control point technology is utilized to realize the initial orientation of the measuring camera under each measuring station; the global control point is utilized to realize the splicing of each measuring point region and the measuring point is utilized to serve as public point to realize the splicing of global control point region. The invention solves the detection problem of the realization of ultra-large spatial curved surface by adopting the close-range photogrammetry method in the case of not utilizing coded marking; and nophysical marking needs to be set on the surface of the detected object, and the surface appearance of the detected object is not slightly interfered.

Description

technical field [0001] The invention relates to a precision measurement method, in particular to an absolute non-interference precision measurement method for super-large spatial complex curved surfaces. Background technique [0002] The measurement of complex curved surfaces (with huge differences in local normal directions) in a super-large space (ranging from tens of meters to tens of meters) is a common and urgent problem in the field of super-large equipment manufacturing such as aerospace and shipbuilding. This type of measurement problem faces more complex technical problems than conventional size measurement, which are highlighted in the following two aspects: First, it is necessary to take into account both the measurement range and measurement accuracy, and achieve submillimeter-level high precision within a measurement range of tens of meters The measurement is quite difficult; the second is the high complexity of the measured surface, and most traditional measure...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24
Inventor 邾继贵吴斌郭磊邹剑林嘉睿
Owner ISVISION (TIANJIN) TECH CO LTD
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