Open-type visual detection method based on featuring matching
A feature matching and visual inspection technology, applied in measurement devices, optical testing of flaws/defects, material analysis by optical means, etc., can solve the problems of high software and hardware costs, difficult secondary development, and long image processing time, etc. To achieve the effect of broadening the application field
Inactive Publication Date: 2012-10-10
HUAHE NEW TECH DEV COMPANY RES INST OF PHYSICAL & CHEM ENG OF NUCLEAR IND
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[0003] When accurately detecting subtle defects of objects, these detection systems require the use of high-speed hardware processing platforms on the one hand, and at the same time have strict requirements on external conditions such as light sources to obtain higher-quality (resolution) images. On the other hand, various complex The processing algorithm processes the image, and the algorithm is often limited to a specific product detection
Therefore, it is determined that these detection systems use different hardware implementation structures, and the secondary development is difficult. At the same time, due to the complex processing algorithms it uses, it takes a long time to process images, and its hardware and software costs are high, which is difficult to meet the needs of modern industries. The demand for high-speed real-time detection of the production line
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[0031] Below, the open visual detection method based on feature matching of the present invention will be described in detail with reference to the accompanying drawings and embodiments:
[0032] Such as figure 1 , 2 As shown, the equipment of the present invention adopts an open visual detection device, and the open visual detection device includes an optical imaging system 1, an output and an input signal of the optical imaging system 1 and an output and an input signal of the embedded hardware processing platform 2 Connected, the output and input signals of the embedded hardware processing platform 2 are respectively connected with the output and input signals of the industrial computer or touch screen 3, the feature matching database 4 and the actuator 5.
[0033] Wherein, the optical imaging system 1 is composed of an intelligent lighting device 6 and a CCD camera 7 . Wherein, the intelligent lighting device 6 includes a light source 18 and a background plate 19 . A fe...
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The invention discloses an open-type visual detection method based on featuring matching, which includes the following steps: (i) setting matching feature information; (ii) collecting the image of an object under detection; (iii) processing the image and extracting the same feature information; (iv) matching features; and (v) outputting matched detection results. The set of detection device can be applicable to the online detection of various products, as the wide-open structure is adopted, the user can perform secondary development on the platform according to specific detection demands. An optical imaging system and an embedded hardware processing platform in the invention for visual detection all adopt modular design, the components can be combined according to actual needs and the application range of the visual detection platform is accordingly expanded.
Description
technical field [0001] The invention belongs to an open visual detection method, in particular to an open visual detection method based on feature matching. Background technique [0002] Early product quality testing generally uses manual testing, which is costly and low in production efficiency, and it is difficult to meet the needs of large-scale industrial production. After the 1980s, due to the rapidity, repeatability, intelligence and fieldability of machine vision, various online inspections based on visual inspection technology have been used in parts quality inspections, industrial and agricultural product inspections, and other industries. The system has been applied concretely. Most of these online detection systems use the purchase of off-the-shelf CCD cameras, the use of image acquisition boards to process industrial control computers, and the host computer develops different processing software by itself. [0003] When accurately detecting subtle defects of ob...
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IPC IPC(8): G01N21/88G01N21/892
Inventor 赵永福徐晓明张海顺王志为刘恩树胥和平王峻松朱体高
Owner HUAHE NEW TECH DEV COMPANY RES INST OF PHYSICAL & CHEM ENG OF NUCLEAR IND