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An aging test apparatus of display module

A display module, aging test technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problems of changing test devices, etc., achieve the effects of easy automatic operation, noise and interference reduction, and improved test efficiency

Active Publication Date: 2010-06-23
SAMSUNG DISPLAY CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in the traditional mother base unit testing method, it is dif

Method used

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  • An aging test apparatus of display module
  • An aging test apparatus of display module
  • An aging test apparatus of display module

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Embodiment Construction

[0031] The present invention will be described more fully hereinafter with reference to the accompanying drawings, in which exemplary embodiments of the invention are shown. As those skilled in the art would realize, the described embodiments may be modified in various different ways, all without departing from the spirit or scope of the present invention.

[0032] Accordingly, the drawings and description are to be regarded as illustrative in nature and not restrictive. Like reference numerals refer to like elements throughout the specification.

[0033] Throughout the specification and claims, when it is described that an element is "coupled to" another element, the element may be "directly coupled to" the other element or "electrically coupled to" the other element through a third element. a component. In addition, unless explicitly stated to the contrary, the word "comprising" will be understood to mean the inclusion of listed elements but not the exclusion of any other ...

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Abstract

The present invention relates an aging test apparatus of a display module. The aging test apparatus of display module according to the invention comprises the following components: two or a plurality of frames which are configured according to a certain distance; a rotatable supporting unit which is rotatablely equipped on the frame; a test unit which is supported by the rotatable supporting unitand tests the module while each module is combined with a display module; a power transmission unit which transmits rotating power to the rotatable supporting unit; a power supply unit which suppliesthe power to the power transmission unit and the test unit; a first connecting unit which is provided on a hollow shaft of the rotatable supporting unit and is electrically connected with the power supply unit and the test unit; and a controller which controls the power transmission unit and the power supply unit and analyzes the data measured by the testing unit.

Description

technical field [0001] The invention relates to an aging test device for a display module. More particularly, the present invention relates to a display module burn-in test device capable of simultaneously performing burn-in and testing of a display module. Background technique [0002] In the manufacturing process of display modules, a process for testing the operation status and durability of each module by applying voltages and signals to the modules for a predetermined period of time is used, which is called a burn-in test. . [0003] For the display modules, the burn-in test was performed on a mother substrate unit on which each module was mounted before being diced from each other. Such a mother base unit burn-in test is frequently used due to the advantages that the test is conveniently performed and defects can be easily detected by mapping the positions where the defects occur. However, since the tests are performed on many modules coupled in series and parallel ...

Claims

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Application Information

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IPC IPC(8): G01R31/00
CPCG02F1/1309G09G3/006
Inventor 金成国
Owner SAMSUNG DISPLAY CO LTD