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An aging test apparatus of display module

A display module, aging test technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve problems such as changing the testing device, and achieve the effects of easy automatic operation, reduced signal delay, and accurate testing

Active Publication Date: 2013-02-20
SAMSUNG DISPLAY CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the traditional mother base unit testing method, it is difficult to change the test device according to the change of the module

Method used

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  • An aging test apparatus of display module
  • An aging test apparatus of display module
  • An aging test apparatus of display module

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Embodiment Construction

[0031] The present invention will be described more fully hereinafter with reference to the accompanying drawings, in which exemplary embodiments of the invention are shown. As those skilled in the art would realize, the described embodiments may be modified in various different ways, all without departing from the spirit or scope of the present invention.

[0032] Accordingly, the drawings and description are to be regarded as illustrative in nature and not restrictive. Like reference numerals refer to like elements throughout the specification.

[0033] Throughout the specification and claims, when it is described that an element is "coupled to" another element, the element may be "directly coupled to" the other element or "electrically coupled to" the other element through a third element. a component. In addition, unless explicitly stated to the contrary, the word "comprising" will be understood to mean the inclusion of listed elements but not the exclusion of any other ...

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Abstract

PURPOSE: An aging test apparatus of a display module is provided to improve the test efficiency thereof by carrying out the test at a test unit while rotating a rotation supporting unit. CONSTITUTION: A rotation supporting unit(130) is installed at two or more than two frames(110) and allows the rotation thereof. A test unit(120) is supported by the rotation supporting unit, and a display module is coupled to the test unit. A power transmission unit(140) transmits rotation power to the rotation supports unit, and a first connection unit is placed at the central axis of the rotation support unit. The first connection unit is electrically connected to a power supply unit(150) and the test unit.

Description

technical field [0001] The invention relates to an aging test device for a display module. More particularly, the present invention relates to a display module burn-in test device capable of simultaneously performing burn-in and testing of a display module. Background technique [0002] In the manufacturing process of display modules, a process for testing the operation status and durability of each module by applying voltages and signals to the modules for a predetermined period of time is used, which is called a burn-in test. . [0003] For the display modules, the burn-in test was performed on a mother substrate unit on which each module was mounted before being diced from each other. Such a mother base unit burn-in test is frequently used due to the advantages that the test is conveniently performed and defects can be easily detected by mapping the positions where the defects occur. However, since the tests are performed on many modules coupled in series and parallel ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG02F1/1309G09G3/006
Inventor 金成国
Owner SAMSUNG DISPLAY CO LTD