Programmable diagnostic memory module

Abstract

A programmable diagnostic memory module provides enhanced testability of memory controller and memory subsystem design. The programmable diagnostic memory module includes an interface for communicating with an external diagnostic system, and the interface is used to transfer commands to the memory module to alter various behaviors of the memory module. The altered behaviors may be changing data streams that are written to the memory module to simulate errors, altering the timing and / or loading of the memory module signals, downloading programs for execution by a processor core within the memory module, changing driver strengths of output signals of the memory module, and manipulating in an analog domain, signals at terminals of the memory module such as injecting noise on power supply connections to the memory module. The memory module may emulate multiple selectable memory module types, and may include a complete storage array to provide standard memory module operation.

Description

[0001] Cross reference to related patent applications [0002] This application involves co-pending U.S. patent applications XX / XXX, XXX, attorney number AUS920070310US2, titled "METHOD FOR PERFORMING MEMORYDIAGNOSTICS USING A PROGRAMMABLE DIAGNOSTIC MEMORY MODULE", which was filed by the same applicant at the same time as this application and assigned to the same Assignee. The aforementioned US patent application is hereby incorporated by reference. Technical field [0003] The present invention generally relates to processing system memory subsystems, and more specifically, to a diagnostic memory module that provides programmable functionality to observe and / or change the behavior of the memory module. Background technique [0004] The memory subsystem in today's computer systems includes multiple memory modules that provide system memory. During the design and manufacture of these computer systems and their components (such as processor blade units or motherboards, specifically...

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Problems solved by technology

The provided test points are also not located at the actual location of the memory device, it cannot be written to and read from, thus only providing measurements of external memory bus signals

Also, test error detection / correction mechanisms using such devices are still limited by techniques such as externally loading test points until an error occurs

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