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Memory bank testing device

A technology for testing devices and memory sticks, applied in static memory, instruments, etc., can solve problems such as damage to the test motherboard, falling off and tilting of memory stick slots, and achieve the effects of low cost, long service life, and simple and stable structure

Inactive Publication Date: 2010-09-15
正文电子(苏州)有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Generally speaking, in the process of testing the memory stick, the memory stick to be tested is usually inserted into the memory stick slot of the main board of the test device to simulate the actual use of the memory stick for testing, because the memory stick slot on the main board is Compared with the motherboard carrier board, it is raised, and there is a gap between the two memory slots, so that it is easy to insert the memory stick into the memory slot of the test device by mistake. In the gap, the gold finger on the memory stick rubs against the shell of the memory stick slot, destroying the coating on the surface of the gold finger and affecting the quality of the memory stick; The memory slot is often tilted due to uneven force. Over time, there is a high possibility of poor contact between the memory slot and the motherboard, which will affect the accuracy or results of the test. In severe cases, the memory slot will fall off the motherboard. damage the test board

Method used

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Embodiment Construction

[0013] The specific embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0014] Such as figure 1 , figure 2 , image 3 with Figure 4 As shown, the memory testing device 100 in the preferred embodiment of the present invention includes a limiting bottom plate 110 and limiting blocks 120 vertically installed at the left and right ends of the limiting bottom plate 110 . There are two first through holes 140 and second through holes 150 for installing the first memory stick slot 410 and the second memory stick slot 430 of the test motherboard on the limit base plate 110; it must be understood that the mainboard 420 is a computer system Or test the system's motherboard. After the first memory stick slot 410 and the second memory stick slot 430 on the motherboard 420 pass through the first through hole 140 and the second through hole 150, the memory testing device 100 uses screws (not shown) to pass thr...

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Abstract

The invention discloses a memory bank testing device, which comprises a testing mainboard and a memory bank slot on the testing mainboard and is characterized by also comprising a limiting bottom plate, wherein the limiting bottom plate is provided with a plurality of through holes for accommodating the memory bank slot; and the left and right ends of the through holes are vertically provided with limiting blocks respectively. Because the memory bank testing device of the invention is provided with the limiting bottom plate and the limiting blocks around the memory bank slot of the testing mainboard, the positioning structure prevents the memory bank slot from being damaged by inserting the memory bank in the slot repeatedly during the test of the memory bank; and in addition, the testing device has the characteristics of low cost, simple and stable structure and long service life.

Description

technical field [0001] The invention relates to a memory stick testing device. Background technique [0002] In today's era of information explosion, the use of personal computers has been increasing day by day. As an important part of the computer, the memory stick is particularly important in its production and testing. Generally speaking, in the process of testing the memory stick, the memory stick to be tested is usually inserted into the memory stick slot of the main board of the test device to simulate the actual use of the memory stick for testing, because the memory stick slot on the main board is Compared with the motherboard carrier board, it is raised, and there is a gap between the two memory slots, so that it is easy to insert the memory stick into the memory slot of the test device by mistake. In the gap, the gold finger on the memory stick rubs against the shell of the memory stick slot, destroying the coating on the surface of the gold finger and affecting ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56
Inventor 郭志刚
Owner 正文电子(苏州)有限公司