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Method and device for analyzing test coverage automatically aiming at automatic test system

A technology of automatic test system and automatic analysis device, which is applied in the direction of detecting faulty computer hardware, etc., to achieve the effect of improving work efficiency and

Inactive Publication Date: 2011-11-16
BEIHANG UNIV
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Problems solved by technology

[0005] In order to solve the above-mentioned problems existing in the existing test coverage analysis work, the present invention provides an automatic test coverage analysis method and device for an automatic test system

Method used

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  • Method and device for analyzing test coverage automatically aiming at automatic test system
  • Method and device for analyzing test coverage automatically aiming at automatic test system
  • Method and device for analyzing test coverage automatically aiming at automatic test system

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Embodiment Construction

[0026] The present invention will be further described in detail with reference to the accompanying drawings and embodiments.

[0027] System test requirements, or test objectives, generally have a top-down tree-like hierarchical structure, the upper-level test requirements are the overall requirements, and the lower-level test requirements are the refinement of the overall requirements. For example, in the test requirements of an electronic device, to realize the "power supply system test", it is necessary to test the voltage value and current value of the power supply separately. The "power system test" in the upper layer is an overall requirement, and the two items of "current test" and "voltage test" in the lower layer are the refinement of the power system test requirements. The test of the power system is divided into "current test" and " Voltage test" two sub-items are carried out. In the present invention, the logical structure of the test requirement is described by ...

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Abstract

The invention provides a method and a device for analyzing test coverage automatically aiming at an automatic test system. The method for analyzing the test coverage automatically mainly comprises the following steps of: establishing a test demand model through visualization; formulating the mapping relation of test items and test demands and test coverage indexes by users; converting the test demand model into a test demand description XML file; and finally, resolving the file to analyze the test coverage. The device for analyzing the test coverage automatically mainly comprises a test demand modeling module, a test demand and test item mapping module, a test coverage index formulating module, a coverage analysis script module and the like, supports the visual modeling on the XML test demands, establishes the mapping relation of the test items and the test demands and the test coverage indexes, and realizes the automatic analysis of the test coverage. The method and the device can assist analysts in analyzing the test coverage automatically and improve working efficiency and the accuracy of analytical results, and the adopted visual operation is simple, quick and convenient.

Description

technical field [0001] The invention relates to the field of computer aided testing of hardware systems, in particular to a method and device for performing test coverage analysis on test results of an automatic test system. Background technique [0002] Test coverage refers to the degree to which the test results meet the test requirements or test objectives after the test of a software or hardware system is completed, and it is used to evaluate whether the test is complete. [0003] Existing test coverage analysis methods and tools are mainly aimed at software codes, including statement coverage analysis, function coverage analysis, etc. For example, the test coverage analysis of functions is performed in an instrumented manner. [0004] Different from the software test coverage analysis, the test coverage analysis involved in the present invention specifically refers to the test coverage analysis based on the obtained test data after the complex electronic equipment is te...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
Inventor 吕伟余丹马世龙
Owner BEIHANG UNIV
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