Accurate measurement method for interface energy release rate of coating film-substrate structure

A technology of energy release rate and coating film, which is applied in the direction of measuring devices, instruments, and mechanical devices, and can solve problems such as measurement and calculation schemes that have not yet been seen

Inactive Publication Date: 2011-08-24
CHONGQING ZHONGKE CONSTR GROUP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This difficulty has been perplexing scholars all over the world in this field. So far, no more accurate measurement and calculation scheme has been seen.

Method used

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  • Accurate measurement method for interface energy release rate of coating film-substrate structure
  • Accurate measurement method for interface energy release rate of coating film-substrate structure
  • Accurate measurement method for interface energy release rate of coating film-substrate structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] Measurement sample making

[0022] Open a radius of small hole.

[0023] Install the "Clamping Punch"

[0024] Clamp the clamping disc cap firmly with the cylindrical punch so that the film in the clamped area cannot be deformed.

[0025] Loading on film

[0026] Load the film as slowly as possible to avoid breakage of the film, and the loading speed is controlled within less than 1 mm per minute, so that the film finally forms a radius of , with a height of bubbling, and the ring area should have a certain large radius , to ensure the validity of the measurement work.

[0027] Measurement

[0028] The present invention does not make specific requirements for measuring instruments, but mainly focuses on providing a method. According to the test conditions, relevant measuring instruments in this field can be used as much as possible. Try to use high-precision measuring instruments to accurately measure the thickness of the coating film , base ope...

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PUM

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Abstract

The invention discloses an accurate measurement method for the interface energy release rate of a coating film-substrate structure. The method comprises the following steps: opening an aperture with the radius of d on the substrate of a film-substrate structure; clamping a film by using a circular clamping plate with the radius of b (b is less than d) on the central part of an aperture area so that the film in the clamped area cannot be deformed; slowly applying an external force F to the film by using the circular clamping plate to separate a coating film from a substrate and form a bubble with the radius of a and the height of wm; increasing measurement density; measuring bubble heights w1, w2,..., wm-1 and wm and corresponding external forces F1, F2,..., Fm-1 and Fm thereof as much as possible; and calculating the interface energy release rate of the coating film in the area separated from the substrate (namely in a circular ring with the radius of a-d) by using the measurement data. The measurement method for the interface energy release rate of the coating film-substrate structure of the invention has the characteristics of simple and feasible operation, few measurement parameters, and high accuracy of obtained energy release rate.

Description

technical field [0001] The invention relates to a technique for accurately measuring the interface energy release rate of a coating film-base structure. Background technique [0002] Thin-layer structures made of different materials, ie thin-film-substrate structures, are increasingly used in many advanced technologies. In the fields of printed circuits and packaging, there are a large number of ultra-thin coating film-base structures. The adhesion strength between the film and the base layer can be evaluated by the adhesion energy per unit area, but the adhesion energy is not convenient to measure. Therefore, the reliability of the film-base structure is usually evaluated by an index called "energy release rate", that is, the energy required to separate the film per unit area from the base layer (ie, the fracture energy). [0003] The measurement and calculation of energy release rate is usually achieved by static load bubbling test (or expansion test) and axial load bubbl...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N19/00G01N19/04
Inventor 孙俊贻许劲何晓婷郑周练胡建力耿欢欢朱海桥
Owner CHONGQING ZHONGKE CONSTR GROUP
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