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SCM controller special for detecting defects of warp-knitted fabrics

A technology of knitted fabric and controller, which is applied in the field of special SCM controller for warp knitted fabric defect detection

Inactive Publication Date: 2011-04-13
JIANGNAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, after using digital image processing technology to complete the defect detection of warp knitted fabrics, there is no clear solution on how to identify the defects and perform preliminary processing.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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  • SCM controller special for detecting defects of warp-knitted fabrics
  • SCM controller special for detecting defects of warp-knitted fabrics
  • SCM controller special for detecting defects of warp-knitted fabrics

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0016] The entire warp-knitted fabric defect detection controller is mainly composed of 89C52 single-chip microcomputer system, and the warp-knitted fabric defect detection processor is mainly composed of a single-chip microcomputer, storage body, communication interface and keyboard display, etc. Process the defect data of warp knitted fabrics in , and the composition block diagram is as follows figure 2 shown. When the warp-knitted fabric defect data is changed, the system microcomputer is used to input the defect data through the RS232 interface and stored in the warp-knitted fabric defect processor.

[0017] Warp-knitted fabric defect memory is used to store defect data, using AM29F016D flash memory with a capacity of 1.5M bytes; keyboard and display are used to input warp-knitted fabric structure parameters and other working parameters; RS-232 serial The line communication interface receives the defect data transmitted from the upper computer; the single-chip microcompu...

example 2

[0021] The entire warp knitted fabric defect detection controller is mainly composed of 8086 single-chip microcomputer system, and the fabric defect processor is mainly composed of single-chip microcomputer, storage body, communication interface and keyboard display, etc., which are used to receive, store and process fabric defects during work Data, composed of block diagrams such as Figure 4 shown. When the fabric defect data is changed, the processed fabric defect data is stored in the U disk, and the fabric defect data of the U disk is read into the memory of the fabric defect processor through the USB interface.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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PUM

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Abstract

An SCM controller special for detecting defects of warp-knitted fabrics belongs to the field of novel textile machinery. The defects of warp-knitted fabrics are characterized by wide varieties,and detection algorithm is complexed, so the specific detect treatment flow needs to be selected according to the variety and relevant characteristics of the defects during defect detection. Adopting simple single software treatment method obviously can not meet the real-time control requirement of defect detection. In order to solve the technical problem, in the invention, a single-chip microcomputer (SCM) is taken as the core of a control system and is used for reading the variety and relevant characteristics of the defects and controlling the subsequent treatment flow of the defects of warp-knitted fabrics so as to meet the real-time control requirement of defect detection treatment, thus completing treatment flow of the defects of warp-knitted fabrics.

Description

technical field [0001] The invention relates to the development of a special control system for warp-knitted fabric defect detection with a single-chip microcomputer as the core, and specifically relates to the use of a single-chip microcomputer to read warp-knitted fabric defect types and related characteristic data and store the information in a memory, and use the data to control stepping motors in real time The action realizes the control of the defect detection and processing mechanism, so as to achieve the effect of real-time processing of defects. Background technique [0002] In the production process of warp knitted fabrics, due to the yarn and weaving process, defects such as slubs, holes, and oil stains will be formed on the fabric surface. After the production of warp knitted fabrics is completed, the computer digital image processing technology can be used to locate the fabric defects and extract the characteristic parameters of the fabric defects to classify th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/04
Inventor 刘基宏潘如如王鸿博高卫东刘建立
Owner JIANGNAN UNIV
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