Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Digital signal processor (DSP) controller special for detecting defects of woven fabrics

A technology of woven fabric and controller, which is applied in the field of special control system for woven fabric defect detection

Inactive Publication Date: 2011-04-20
JIANGNAN UNIV
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, after using digital image processing technology to complete the defect detection of woven fabrics, there is no clear solution on how to identify the defects and perform preliminary processing.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Digital signal processor (DSP) controller special for detecting defects of woven fabrics
  • Digital signal processor (DSP) controller special for detecting defects of woven fabrics
  • Digital signal processor (DSP) controller special for detecting defects of woven fabrics

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0016] The entire woven fabric defect detection controller is mainly composed of a TMS320 digital signal processor system, and the woven fabric defect detection processor is mainly composed of a digital signal processor, a memory bank, a communication interface and a keyboard display. Processing woven fabric defect data, the composition diagram is as follows figure 2 shown. When the defect data of woven fabric is changed, use the system microcomputer to input the defect data through RS232 interface and store it in the woven fabric defect processor.

[0017] The woven fabric defect memory is used to store the defect data; the keyboard and the display are used to input the woven fabric structure parameters and other working parameters; the RS-232 serial communication interface receives the defect data transmitted from the host computer; the digital signal processor is responsible for the entire defect processing The operation control and data processing of the machine.

[001...

example 2

[0021] The whole woven fabric defect detection controller is mainly composed of ADSP2100 digital signal processor system, and the fabric defect processor is mainly composed of digital signal processor, storage body, communication interface and keyboard display, etc., which are used for receiving, storing and processing fabrics during the working process. Defect data, composed of a block diagram such as Figure 4 shown. When the fabric defect data is changed, the processed fabric defect data is stored in the U disk, and the U disk fabric defect data is read into the memory of the fabric defect processor through the USB interface.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a digital signal processor (DSP) controller special for detecting defects of woven fabrics, belonging to the field of novel textile machinery. The woven fabrics have the defects of wide varieties and complex detection algorithm, so the specific defect treatment flow is needed to be selected according to the varieties and relevant characteristics of the defects during defect detection. By adopting a simple single software treatment method, the real-time control requirement of defect detection can not be met obviously. In order to solve the technical problem, in the invention, a DSP is taken as the core of a control system and is used for reading the varieties and relevant characteristics of the defects and controlling the subsequent treatment flows of the defects of the woven fabrics so as to meet the real-time control requirement of defect detection treatment, thus completing the treatment flows of the defects of the woven fabrics.

Description

technical field [0001] The invention relates to the development of a special control system for defect detection of woven fabrics with a digital signal processor as the core, in particular to the use of a digital signal processor to read defect types and relevant characteristic data of woven fabrics, store the information in a memory, and use the data to control steps in real time Into the motor action to realize the control of the defect detection and processing mechanism, in order to achieve the effect of real-time defect processing. Background technique [0002] In the production process of woven fabrics, defects such as slub, missing warp, missing weft, holes, and oil stains will be formed on the fabric due to the yarn and weaving process. After the production of woven fabrics, computer digital image processing technology can be used to locate the fabric defects, extract the characteristic parameters of the fabric defects, and classify the defects. After completing the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/042
Inventor 潘如如刘基宏王鸿博高卫东刘建立
Owner JIANGNAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products