Inspection apparatus for appearance of workpiece and inspection method thereof

Abstract

The invention provides an inspection apparatus for the appearance of a workpiece and an inspection method thereof,wherein workpieces can be correctly positioned on a conveyance workbench and the electrostatic destruction or the characteristic deterioration of the workpieces are avoided.The inspection apparatus (30) for the appearance of workpieces comprises a linear feeder (1) for transferring hexahedron-shaped workpieces (W),a conveyance workbench (2), a transferring arrangement unit (21), an electrifying unit (6A) and an imaging unit(20).The conveyance workbench (2) transfers and transportsthe workpieces (W) obtained from the linear feeder (1).The workpieces (W) obtained from the linear feeder (1) are then transferred and arranged on the conveyance workbench (2) by the transferring arrangement unit (21).The lower surface of the conveyance workbench (2) is electrified and the workpieces are held by the electrifying unit (6A).The six surfaces of the workpieces (W) are recorded by theimaging unit (20).The transferring arrangement unit (21) comprises a vibration-free part (4) arranged between the linear feeder (1) and the conveyance workbench (2) and an arrangement guiding part (7).The workpieces are arranged in a W shape by the arrangement guiding part (7).When viewed from a plane, the arrangement guiding part (7) is equipped with a linear guiding face (7a).

Description

technical field [0001] The present invention relates to a workpiece appearance inspection device and a workpiece appearance inspection method that image a hexahedron of the workpiece while conveying the hexahedron workpiece. Background technique [0002] Conventionally, as an appearance inspection device for a chip-shaped electronic component such as a hexahedral resistor or capacitor (hereinafter referred to as a "workpiece"), there is known a device in which the workpiece is placed on a transparent body made of glass or the like. On the transfer table, while the transfer table is rotated to transfer the workpiece, an image pickup unit such as a camera takes pictures of each surface for visual inspection. [0003] In this case, the workpiece conveying table of the visual inspection device uses static electricity to electrostatically attract and convey the workpiece. [0004] That is, first, the workpiece is charged on the linear feeder (Linear Feeder) that aligns and conve...

AI Technical Summary

Problems solved by technology

However, when transferring workpieces from the linear feeder to the transfer table, the workpieces may not always be transferred in a fixed direction. Since the posture of the workpiece after transfer is fixed by electrostatic attraction, the Subtle differences occur in the posture of each workpiece, which may reduce the imaging accuracy

[0008] In addition, the workpiece is charged while being conveyed in the linear feeder, so the workpiece is attracted to the linear feeder by virtue of electrostatic adsorption during conveyance, which may cause a decrease in conveying speed, and in the worst case cause the workpiece to stop

[0009] The second problem is to reduce the electrostatic adsorption force after the workpiece is transferred

Therefore, part of the charge of the workpiece immediately before being transferred to the transfer table is canceled, and in this case, the electrostatic attraction force acting on the workpiece placed on the transfer table is reduced.

[0011] The third problem is the impact of static electricity on the workpiece

When the workpiece placement surface is brought into contact with the workpiece by the above-mentioned workpiece transfer, there is a risk of electrostatic breakdown of the workpiece or deterioration of characteristics due to charge cancellation due to the movement of the accompanying charges.

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