Electrode for high-voltage in-situ impedance spectroscopy measurement and its preparation method and application

Abstract

The electrode for high-voltage in-situ impedance spectroscopy measurement of the present invention and its preparation method and application belong to the technical field of in-situ measurement of electrical quantities under high-voltage conditions. The electrode consists of an aluminum oxide protective layer (3) deposited on the surface of the diamond anvil (2) and a metal film electrode (1); the metal film electrode (1) is circular in the center of the anvil surface of the diamond anvil (2), Copper wire (5) is bonded to the metal film electrode (1) on the side of the diamond anvil (2); the metal spacer (4) is used as another electrode, forming an axisymmetric electrode together with the metal film electrode (1) system. Electrodes are prepared by magnetron sputtering, molybdenum coating, aluminum oxide deposition, photolithography and chemical corrosion. The invention solves the problems of electrode fixing and sample cavity insulation, and can ignore the influence of the parasitic capacitance and inductance of the system on the measurement results, making it possible to measure the material impedance spectrum in situ with the diamond anvil under high pressure.

Description

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AI Technical Summary

Benefits of technology

In this new technique called AC Impedence Spectroscopy (ACS), which was developed by Chinese scientists during their researches for materials science, there are technical improvements over previous methods such as electron beam lens micrograph analysis or atomic force microscope techniques used earlier. These improved measurements allow us to study how different types of matter behave differently when subjected to very large electric fields without affecting any other things nearby.

Problems solved by technology

This patented describes different ways to measure material's electric characteristics during high pressures without having to manually attach or connect external devices like resistors or inductive couplers onto the surface being measured. These techniques require precise placement of both elec trodes inside the device while still achieving complete isolation between them. Additionally, current methods involve injecting AC signals through conductor assemblies connected by cables, making it challenging to achieve accurate measurements due to factors such as temperature variations and magnetic field interference caused by strong alternations at frequencies near 500 kHz.

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