Test integrity control system and method
A technology for testing control and control systems, which is applied in the detection of faulty computer hardware and functional testing, etc. It can solve problems such as weak file protection and unreliable test results, and achieve the effect of strengthening integrity.
Active Publication Date: 2012-03-14
ROPEOK TECHNOLOGY GROUP CO LTD
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AI Technical Summary
Problems solved by technology
When testing electronic equipment, testers tend to change the test process and test some less test items, so there is a risk of unreliable test results
For example, when testing electronic equipment under the DOS system, because the DOS system has weak file protection, it is easy for the tester to modify the batch file that controls the test process to test less test items
Method used
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Embodiment Construction
[0014] refer to figure 1 As shown, it is a schematic diagram of an application environment of a preferred embodiment of the test integrity control system of the present invention. The test integrity control system 10 runs in a data processing device 11 (such as a server) with a motherboard management controller 12 and is used to control the test process of the electronic device 13 . The motherboard management controller 12 includes a FRU (Field Replacement Unit, field replaceable unit) storage area 14 . This FRU storage area 14 has the storage space of more than 1024 bytes, the data in the FRU storage area 14 has higher security, there is difficulty in the data of tester's reading and writing wherein (requires special skill and tool), and does not know In the case of the specific storage address of the data, it is difficult for the tester to obtain the data.
[0015] refer to figure 2 shown, is figure 1 A functional block diagram of the test integrity control system 10 . ...
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The invention discloses a test integrity control system, which is operated in data processing equipment with a mother board management controller, wherein the mother board management controller comprises an FRU (Field Replaceable Unit) storage region; the system comprises a construction module, a testing module, a comparison module and an output module; the construction module is used for constructing test control data of electronic equipment and writing the test control data into the FRU storage region; the test control data comprise a test bit and a flag bit; the testing module is used for selecting a test item of the electronic equipment one by one for test according to the test control data and negating the test bit corresponding to the selected test item in the test control data if the selected test item is successfully tested; the comparison module is used for comparing the test control data which change after the test with the initially constructed test control data after all test items are tested; and the output module is used for outputting a test result for the test of the electronic equipment according to a comparison result. The invention also provides a test integrity control method. Through the system and the method, the integrity of a test flow can be enhanced.
Description
technical field [0001] The invention relates to a system and method for controlling a test flow, in particular to a test integrity control system and method. Background technique [0002] Testing of electronic equipment (such as a motherboard) often includes numerous test items (such as memory testing, CPU testing, south bridge testing, north bridge testing, etc.). When testing electronic equipment, testers tend to change the test process and test some test items less, so there is a risk of unreliable test results. For example, when testing electronic equipment under the DOS system, because the DOS system has weak file protection, it is easy for the tester to modify the batch file that controls the test process to test less test items. Contents of the invention [0003] In view of the above, it is necessary to provide a test integrity control system that can strengthen the integrity of the test process. [0004] In addition, it is also necessary to provide a test integri...
Claims
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IPC IPC(8): G06F11/22
CPCG06F11/26
Inventor 唐新桥钟阳
Owner ROPEOK TECHNOLOGY GROUP CO LTD