Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Reuse test device for accelerating service life and degeneration of lighting device

A technology for accelerated life testing and lighting devices, which is applied in the field of accelerated life and accelerated degradation multiplexing test devices and accelerated test devices for lighting devices. It can solve problems such as the influence of power supply status of other channels and achieve high research efficiency.

Inactive Publication Date: 2012-05-02
BEIHANG UNIV
View PDF5 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In a general multi-channel experimental device, a simple parallel structure is often used for the test, but the product status of a certain channel will affect the power supply status of other channels

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Reuse test device for accelerating service life and degeneration of lighting device
  • Reuse test device for accelerating service life and degeneration of lighting device
  • Reuse test device for accelerating service life and degeneration of lighting device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] The present invention will be further described below in conjunction with accompanying drawings and examples.

[0033] Such as figure 1 A general-purpose accelerated life and accelerated degradation test device for lighting devices is shown, which consists of three parts: a test box, a data acquisition card and a computer. The signal flow between the three parts is as follows figure 2 Shown: The test is set up through the computer control interface; the data acquisition card receives the control signal from the computer, converts it into digital and analog signals and sends them to the test chamber, and collects real-time data in the test chamber, sends them to the computer, and passes The control program developed by Labview is displayed and stored graphically. This device can test 16 lighting devices at the same time, and apply four sets of different stress values. For each unit circuit, the principle is as follows: image 3 Shown: The signal collected by the data...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a reuse test device for accelerating the service life and the degeneration of a lighting device, which comprises a test box, a data acquiring card and a computer. A control interface of the computer is used for setting a test; and the data acquiring card is used for receiving control signals from the computer, converting the control signals into digital signals and analog signals, transmitting the digital signals and the analog signals into the test box, acquiring real-time data in the test box, transmitting the real-time data into the computer, and displaying and storing in an image way by a control program developed by a Labview. A multi-route independent constant current control structure is adopted by the application of the test stress in the device, so that the stress conditions of all test pieces cannot be influenced by one another. The device can be used for realizing convenient and fast operation control and the visual data display, supporting multiple test schemes such as defining time, defining number, sequencing and the like, comparing the accuracy degrees of different degeneration accelerating models and service life accelerating models, and developing a new model, thereby being higher in researching efficiency. The reuse test device is better in practical value and wide in application prospect in the technical field of the product test.

Description

1. Technical field [0001] The invention relates to an accelerated test device, in particular to a lighting device accelerated life and accelerated degradation multiplex test device. The invention belongs to the technical field of product testing. 2. Background technology [0002] At present, the life of lighting devices is a key indicator of lamp quality, and it is necessary to test related parameters and inspect the service life. In the past, this work was mainly estimated based on the actual use process of the product, which is extremely inaccurate, and is quite different from the real use environment, and the detection accuracy of reliability and life is low. [0003] Accelerated life test is a test method that increases the test stress and accelerates the failure process of the product without changing the failure mechanism of the product or adding new failure factors. According to the results of the accelerated life test, the life characteristics of the product under ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/44
Inventor 姚金勇李元贾宇
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com