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Defect detection method and system

A defect detection and to-be-detected technology, applied in the field of detection, can solve the problems of complex image misdetection, easy to be interfered by light changes, etc., to achieve high detection accuracy, reduce image edge interference, and low false detection rate.

Inactive Publication Date: 2012-06-20
深圳市宝捷信科技有限公司
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Problems solved by technology

[0005] The purpose of the present invention is to provide a defect detection method, which aims to solve the problems of the prior art that are easily disturbed by light changes and complex images are prone to misdetection when performing defect detection.

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  • Defect detection method and system
  • Defect detection method and system

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Embodiment Construction

[0023] In order to make the object, technical solution and beneficial effects of the present invention more clear, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0024] In the embodiment of the present invention, image acquisition and preprocessing are performed on the device to be detected, and a difference operation is performed between the pre-stored gray scale template and the preprocessed collected image to obtain a gray scale template difference image; for the gray scale template difference image Perform binarization processing to obtain the difference binarized image; perform difference operation on the pre-stored binary template and the difference binarized image to obtain the difference image of the binary template; perform contour search...

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Abstract

The invention is suitable for the field of detection, and provides a defect detection method and a system. The method comprises the following steps of: acquiring the image of equipment to be detected, and preprocessing the acquired image; performing difference operation on a pre-stored grey scale template and the preprocessed acquired image to obtain a grey scale template difference image; performing binary processing on the grey scale template difference image to obtain a difference binary image; performing difference operation on a pre-stored binary template and the difference binary image to obtain a binary template difference image; and performing profile search on the binary template difference image, and judging whether the equipment to be detected has any defect according to a result of the profile search. Due to the adoption of the detect detection method based on dual template matching, image edge interference caused by light ray variation is reduced; and in particular for detection equipment with a complex surface, a false drop rate can be lowered effectively, detection accuracy is increased, and high practicability is achieved.

Description

technical field [0001] The invention belongs to the detection field, in particular to a defect detection method and system. Background technique [0002] Defect detection is an important field of machine vision applications. Defect detection usually refers to the detection of surface defects of objects. Surface defect detection uses advanced machine vision detection technology to detect spots, pits, scratches, color differences, and defects on the surface of workpieces. Check for defects. [0003] As a common algorithm in the field of machine vision, template matching algorithm is also widely used in defect detection. The quality of the template matching algorithm will directly affect the detection results. The general template matching algorithm is to save a template, and then directly perform a difference operation to obtain a defect image. However, due to the diversity of on-site detection environments, it is difficult to find a template matching algorithm that can ada...

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Application Information

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IPC IPC(8): G06T7/00
Inventor 张俊梁日雄李运秀杨江华廖家亮余加波李佐广李耀华
Owner 深圳市宝捷信科技有限公司
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