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Method for measuring surface structure of display device

A display device and surface structure technology, applied in the field of display device surface structure and measuring its surface structure size, display device and measuring its surface structure, can solve the problem of product yield decline, accuracy and reproducibility of structure size measurement results Poor, unable to obtain uniform reflected light and other problems

Inactive Publication Date: 2012-07-04
华映视讯(吴江)有限公司 +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, in order to arrange more pixels in a smaller space to provide higher resolution, the width of the light-shielding layer between each pixel must be reduced and cannot provide a single plane with sufficient width, so that the measurement beam is irradiated on the patterned surface. When the light-shielding layer 214 cannot obtain uniform reflected light, the accuracy and reproducibility of the measurement results of the structure are poor, which in turn creates difficulties for the manufacturing process that relies on the measurement results to adjust the manufacturing parameters, resulting in a decline in product yield and The downside of reduced yield

Method used

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  • Method for measuring surface structure of display device
  • Method for measuring surface structure of display device
  • Method for measuring surface structure of display device

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Embodiment 1

[0022] See Figure 5 , A display device 300 of an embodiment of the invention, such as a liquid crystal display, includes: a first substrate 310 having a first surface 312;

[0023] A first patterned light-shielding layer 322, including a plurality of first openings 324, disposed on the first surface 312 of the first substrate 310;

[0024] At least one second patterned light-shielding layer 332, including a plurality of second openings 334, disposed between the first patterned light-shielding layers 322 on the first surface 312 of the first substrate 310;

[0025] The at least one first pixel unit 326 includes:

[0026] At least one first red filter layer 326R, at least one first blue filter layer 326B, and at least one first green filter layer 326G respectively cover the first openings 324 of the first patterned light-shielding layer 322 And a part of the first patterned shading layer 322;

[0027] At least one columnar spacer 328 is disposed in the first patterned light-shielding la...

Embodiment 2

[0034] See Figure 5 versus Image 6 , Image 6 for Figure 5 A plan view of the first substrate 310 of the second embodiment of the present invention, the method for measuring the surface structure of a display device includes:

[0035] Providing a display device 300, such as a liquid crystal display, including: a first substrate 310 having a first surface 312;

[0036] A first patterned shading 322, including a plurality of first openings 324, disposed on the first surface 312 of the first substrate 310;

[0037] At least one second patterned light-shielding layer 332, including a plurality of second openings 334, disposed between the first patterned light-shielding layers 322 on the first surface 312 of the first substrate 310;

[0038] The at least one first pixel unit 326 includes:

[0039] At least one first red filter layer 326R, at least one first blue filter layer 326B, and at least one first green filter layer 326G respectively cover the first openings 324 of the first pattern...

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Abstract

The invention discloses a method for measuring a surface structure of a display device. The display device comprises a first substrate, first graphical light shield layers, at least one second graphical light shield layer, at least one first pixel unit and at least one second pixel unit, wherein the first substrate is provided with a first surface; each first graphical light shield layer comprises a plurality of first opening parts; each second graphical light shield layer comprises a plurality of second opening parts and is arranged between the first graphical light shield layers on the first surface of the first substrate; each first pixel unit comprises at least one first bulge and at least one second bulge, wherein the first bulges respectively cover on the first opening parts of the first graphical light shield layers, and the second bulges are arranged in the first graphical light shield layers and the second graphical light shield layers; each second pixel unit comprises at least one third bulge; and the dimensions of the second opening parts of the second graphical light shield layers are less than the dimensions of the first opening parts of the first graphical light shield layers. Compared with the first graphical light shield layers, bigger reflection planes are provided by the second graphical light shield layers, so that a measurement result on the clear height of each second light shield layer is more accurate and has higher reproducibility than that on the clear height of each first graphical light shield layer.

Description

[0001] The present invention is a divisional application of a Chinese invention patent application with an application number of 201010114496.7, an application date of February 9, 2010, and an invention title of "a display device and a method for measuring its surface structure". Technical field [0002] The present invention relates to a display device and a method for measuring its surface structure, in particular to a display device surface structure and a method for measuring the size of its surface structure, which is applied in the field of display devices. Background technique [0003] In recent years, display products have been designed with light, thin, short, small, and high-resolution concepts. However, such requirements have made the design, manufacturing and size measurement of the internal structure of the display encounter great difficulties. Setting more pixels in the space to provide higher resolution often results in insufficient space between various structures, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/13G02F1/1335G02F1/1339G02F1/167G01B11/02
Inventor 林志维王闵正陈雍程刘泓旻
Owner 华映视讯(吴江)有限公司
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