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Dynamic fault tree analysis method for system with correlated failure mode

A dynamic fault tree and failure-related technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve problems such as quantitative analysis of failure-related modes, and achieve the effect of ensuring reliability and reducing maintenance and replacement costs

Inactive Publication Date: 2012-07-04
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

[0006] The purpose of the present invention is to overcome the defect that the existing dynamic fault tree analysis method cannot quantitatively analyze the failure-related modes, and proposes a dynamic fault tree analysis method with failure-related mode systems

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  • Dynamic fault tree analysis method for system with correlated failure mode
  • Dynamic fault tree analysis method for system with correlated failure mode
  • Dynamic fault tree analysis method for system with correlated failure mode

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Embodiment Construction

[0022] The technical solution of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0023] Such as Figure 5 As shown, the dynamic fault tree analysis method for systems with failure-related modes includes the steps:

[0024] Step 1: Define failure-related modes.

[0025] A failure-dependent mode is one in which the failure of one component causes a change in the failure rate of other components. The failure rate refers to the probability of failure per unit time after a certain moment of work for a product that has not yet failed. Generally, the failure rate is recorded as λ, which is also a function of time t, so it is also recorded as λ(t). λ(t) is called the failure rate function, sometimes also called the failure rate function or risk function.

[0026] Such as figure 1 Shown is a specific embodiment of the invention, figure 1 Among them, the flight control computer (referred to as the flight control computer) has...

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Abstract

The invention relates to a dynamic fault tree analysis method for a system with a correlated failure mode, comprising the following steps of: 1, defining the correlated failure mode; 2, defining a correlated failure gate corresponding to the correlated failure mode; 3, solving the correlated failure gate through a Markov chain; 4, establishing a dynamic fault tree model of the system through the correlated failure gate; and 5, solving the dynamic fault tree model of the system to obtain the reliability of the system. The dynamic fault tree analysis method has the beneficial effects that the reliability of the correlated failure mode can be quantitatively calculated through analyzing and calculating the reliability of the correlated failure mode, so that the reliability of the system can be accurately obtained, and the maintenance and replacement costs of parts can be effectively reduced on the premise of ensuring the reliability of the system.

Description

technical field [0001] The invention belongs to the technical field of reliability analysis of electromechanical products, in particular to a dynamic fault tree analysis method for systems with failure-related modes. Background technique [0002] Reliability engineering has been widely used in various engineering fields. The aviation industry is a highly sophisticated and comprehensive industry. Some aviation products will be related to the life safety of pilots and passengers, while some aviation products will be related to the success or failure of the entire war situation. Therefore, reliability engineering is particularly important for the aviation industry. The reliability of aviation products mainly studies the basic principles and methods of reliability and technical measures to ensure the level of product reliability. [0003] In recent years, the role of drones in the field of aviation has become more and more important. Since the Gulf War in 1991, many countries h...

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Application Information

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IPC IPC(8): G06F19/00
Inventor 黄洪钟刘宇孙健李海庆李彦锋汪忠来袁容
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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