Optical index measurement system

Abstract

The invention discloses an optical index measurement system comprising a charge-coupled device (CCD) and an optical index transmission apparatus that is used to extract a laser beam from a high integration system and provide the laser beam for a CCD to carry out measurement. The apparatus comprises a pedestal, a frame, and a support body that can be expanded freely and is respectively connected with the pedestal and the frame. And a light guiding lens is arranged in the frame. According to the invention, advantages of the system are as follows: because there is no need to divide the system into a plurality of portions or parts to carry out off-line measurement, the light beam can be taken out from a compact structure randomly in an on-line mode, so that measurement efficiency is substantially improved; by employing on-line measurement, interferences of a plurality of off-line measurement results on a whole measurement result of the system can be avoided; and the provided technical scheme is suitable for a system with high integration and has strong practicability.

Description

technical field [0001] The invention relates to the field of laser technology, in particular to a device used in highly integrated systems for transmitting optical indicators. Background technique [0002] At present, due to the high degree of integration of large-scale systems, the measurement data can only be obtained from the final integrated system, and factors such as spot deformation related to optical indicators can only be measured by the indicators obtained from the final measurement, so its The measurement efficiency is not high, and many systems in the measurement process also cause great interference to the measurement results. [0003] When measuring a relatively complex large-scale system, the large-scale system is usually divided into several groups / parts for off-line measurement, and then assembled after measuring the indicators; in order to meet the final system indicators during the system assembly process, it is also necessary to Key indicators are measur...

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Problems solved by technology

[0006] Further, due to the complexity of the measurement system described in the above technical solution, if the system output light spot has a certain deformation, then if it is necessary to ensure the optical quality of the imaging system lens in the measurement system and ensure that the near-field CCD3 and far-field CCD4 are in the field of view The position of the focal plane will be difficult due to the different postures of the devices or the need to debug hundreds of devices

[0007] It can be seen that for a complex system, if it is necessary to trace back to the initial debugging state of the system because of an unqualified index, the efficiency of system debugging will be greatly reduced; and in a complex system, due to the large number of components and the Highly integrated, it is almost impossible to extract the beam in-line in this compact structure

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