Variable-frequency test data sampling and storage method

Abstract

The invention provides a variable-frequency test data sampling and storage method, which comprises the following steps of: acquiring data at an actual frequency f of 1,000 Hz; respectively storing the acquired data into a cache with n channels according to the channels; setting the acquisition frequency of each channel and acquiring the effective number of data to be stored at each time; and gradually traversing the data from 0 to 999 in the channels of the cache, sequentially compressing the acquired data in the cache in the form of binary according to the sampling frequency of each channel, recording channel information and relevant information on the head and the tail, and storing to a memory. The variable-frequency test data sampling and storage method has the advantages that a data sampling and storage frequency is changed at any time, and the hardware bottom layer configuration is not changed, so that frequent hardware bottom layer operation and calibration work are avoided, and a tester can flexibly select the data to be recorded conveniently.

Description

technical field [0001] The invention relates to a data processing method, in particular to a method for variable-frequency sampling and storage of test data. Background technique [0002] In the prior art, the sampling frequency of test data is generally set by hardware switch jumpers or by changing configuration function parameters. In order to ensure the reliability of test data collection, once the frequency is set, it is rarely changed. If you need to change the acquisition frequency, you must manually set the jumpers and switches of the hardware, or call the underlying hardware configuration function. The work efficiency is low, and it cannot adapt to the test requirements of many acquisition channels and frequent frequency changes. At the same time, frequently changing the acquisition frequency of the hardware may reduce the reliability of the acquisition system. [0003] For example, an acquisition card (PXI-2200) needs to set at least 4 counter parameters during the...

AI Technical Summary

Problems solved by technology

The setting and changing of these parameters must call the corresponding configuration function before each test, and every change of the underlying parameters of the hardware needs to be self-checked and the measurement error and accuracy need to be re-checked, the process is cumbersome

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