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Test slot bracket

A technology of test slots and brackets, applied in the direction of digital signal error detection/correction, digital recording/reproduction, data recording, etc., which can solve problems such as low output, excessive vibration, and loose magnetic heads

Inactive Publication Date: 2016-01-20
TERADYNE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This vibration "crosstalk" along with external vibration sources can cause crash failures, head looseness and non-repeatable off-track (NRRO), which can result in lower yields and increased manufacturing costs
Current disk drive testing systems employ automated and structured support systems that cause excessive vibration in the system and / or require a large footprint

Method used

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Examples

Experimental program
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Embodiment Construction

[0049] System Overview

[0050] like figure 1 As shown, the storage device testing system 10 includes a plurality of test racks 100 (eg, 10 test racks are shown), a transfer station 200 , and an automated control device 300 . like Figure 2A and 2B As shown, each test stand 100 generally includes a base 102 . The base 102 may be constructed from a plurality of structural members 104 (eg, formed sheet metal, extruded aluminum, steel tubing, and / or composite members) that are fastened together and collectively define a plurality of brackets. Shelf container 106 .

[0051] Each of the rack receptacles 106 may support a test slot rack 110 . like Figure 3A and 3B As shown, each test slot carrier 110 supports a plurality of test slot assemblies 120 . Different ones of the test slot bays 110 may be configured to perform different types of tests and / or to test different types of storage devices. The test slot racks 110 are also interchangeable with each other in the plural...

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Abstract

The present invention discloses a test rack for a storage device testing system, the test rack including a plurality of test slot brackets. Each of the test slot carriers includes a plurality of test slot assemblies. The test slot assembly is configured to receive and support a storage device to be tested. The test stand also includes a base. The base includes a plurality of carrier receptacles for releasably receiving and supporting the test slot carrier. The test slot trays are interchangeable between the respective tray containers.

Description

technical field [0001] The present invention relates to test slot trays and related apparatus, systems, and methods. Background technique [0002] Storage device manufacturers typically test the storage devices they manufacture against a set of requirements. Test equipment and techniques exist for testing large numbers of storage devices in series or in parallel. Manufacturers tend to test large numbers of storage devices simultaneously or in batches. Storage device testing systems typically include one or more tester racks having a plurality of test slots that receive storage devices to be tested. In some cases, the storage device is provided in a bay for loading and unloading the storage device to and from the test rack. [0003] Condition the test environment in close proximity to the storage device. Minimal temperature fluctuations in the test environment can be critical for precise test conditions and safety of storage setups. Additionally, the latest generation of...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11B20/18G11B33/02
CPCG11B20/00007G11B25/043G11B33/128
Inventor 布莱恩·S·梅洛瓦尔奎里奥·N·卡瓦略约翰·P·托斯卡诺
Owner TERADYNE
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