System and method for circuit testing

Abstract

The invention discloses a system and a method for circuit testing, belonging to the field of circuit testing. The system comprises a pin connection module, a crossing matrix module, a processing module, an interface communication module and a control module. The pin connection module is used for connecting pins of a to-be-tested circuit, and comprises a first electronic switch; the crossing matrix module is used for connecting the pins of the to-be-tested circuit through the pin connection module, and comprises a second electronic switch; the processing module is used for obtaining, transmitting and recording operation instructions, and test procedure information and test result data corresponding to the operation instructions; the interface communication module is connected with the processing module and used for obtaining and transmitting the operation instructions, the test procedure information and the test result data; and the control module is used for controlling the first electronic switch and the second electronic switch according to the operation instructions, thereby realizing the pin interconnection operation on the to-be-tested circuit and the signal test operation on the to-be-tested circuit, and transmitting the test procedure information and the test result data to the processing module through the interface communication module. By the system and the method provided by the invention, the circuit testing cost can be reduced, and the testing efficiency can be improved.

Description

technical field [0001] The present application relates to the field of circuit testing, in particular to a circuit testing system and method with the functions of pin intelligent interconnection, signal testing and test result data recording. Background technique [0002] The core of any electronic product is composed of various electronic components, including integrated circuit chips, resistors, capacitors, diodes, triodes, etc. These electronic components need to be repeatedly designed and tested by engineers to achieve the expected functions, which is the task of electronic product development. In the process of electronic product development, circuit design, circuit testing and test result data recording are all engineers need to experience. However, the current methods of circuit design, circuit testing, and test result data recording are not integrated enough and inefficient to achieve efficient R&D work. [0003] First of all, at the beginning of electronic product...

AI Technical Summary

Problems solved by technology

[0006] To sum up, the existing circuit test schemes have disadvantages such as complex wiring, error-prone, space-consuming, strong signal interference, time-wasting, and high debugging costs, and the workload of engineers’ test result data recording is very large, which reduces the R&D efficiency

Images