All-optical analog-to-digital conversion structure based on double-drive M-Z type modulator and realization method

An implementation method and modulator technology, applied in optical analog/digital converters, optics, instruments, etc., can solve problems such as difficulty in achieving quantification accuracy

Inactive Publication Date: 2012-11-28
BEIJING JIAOTONG UNIV
View PDF5 Cites 24 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the nonlinear effect puts forward high requirements on the sampling optical pulse, so it is difficult to achieve high quantization accuracy

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • All-optical analog-to-digital conversion structure based on double-drive M-Z type modulator and realization method
  • All-optical analog-to-digital conversion structure based on double-drive M-Z type modulator and realization method
  • All-optical analog-to-digital conversion structure based on double-drive M-Z type modulator and realization method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] The design of the all-optical analog-to-digital conversion structure based on the dual-drive Mach-Zender (M-Z) type modulator of the present invention needs to consider the half-wave voltage of the electrodes in the two arms of the M-Z interferometer, when the input analog electrical signal The peak value is twice the half-wave voltage, that is, V s (t) peak value is V π1 when twice the The variation range of is exactly 0 to 2π. By precisely controlling the DC voltage V applied to the other arm b A phase shift of π / N between two adjacent channels can be realized, so that optical analog-to-digital conversion can be realized. The laser source can be generated by a mode-locked laser, and the comparator threshold is half of the maximum electrical signal output by the detector. To achieve N R bit precision, available A M-Z modulator to achieve.

[0031] The present invention can use commercially available dual drive M-Z modulators. The analog electrical signal to b...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

An all-optical analog-to-digital conversion structure based on a double-drive Mach-Zender (M-Z) type modulator belongs to the field of analog-to-digital converters and is realized by N double-drive M-Z modulator arrays with equal half wave voltage. An analog electrical signal to be converted is modulated to an optical pulse at one arm of the M-Z modulator through a radio frequency port and proper direct current voltage is applied at the other arm, so that a phase offset generated by the direct current voltage between each two adjacent channels at the outer end is phi/N, and further, a transmission function of the M-Z modulator generates linear translation relative to input analog signal voltage. The modulated N paths of optical pulses are compared and judged by a photoelectric detector and a comparator to obtain N paths of linear binary encoding digital signals. The method is simple in structure, easy in realization and high in conversion digit.

Description

technical field [0001] The invention relates to an optical analog-to-digital converter in the field of optoelectronic technology, in particular to realizing analog-to-digital conversion in the optical domain by using a dual-drive M-Z (Mach-Zender, Mach-Zender) modulator array. Background technique [0002] An analog-to-digital converter (ADC for short) is a device that converts an analog signal into a corresponding digital signal, and it builds a bridge between the digital world and the analog world. [0003] Most of the information in nature exists in the form of analog signals, but analog signals have disadvantages such as poor confidentiality and weak anti-interference ability. Nowadays, various digital devices are widely used, so that analog signals must be converted into digital signals for processing. Compared with the analog system, the digital system has excellent anti-interference, stability, processing accuracy, integration and so on. In order to complete the sig...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G02F7/00G02F1/35
Inventor 章琎王目光杨子文李唐军
Owner BEIJING JIAOTONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap