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Novel support used for calibrating transient electromagnetic field uniformity quickly

A new type of bracket and electromagnetic field technology, applied in the direction of electromagnetic field characteristics, machine/bracket, supporting machine, etc., can solve the problems of slow calibration speed, inconvenient calibration of transient electromagnetic field uniformity, etc., to achieve faster calibration speed, low production cost, The effect of high adjustment precision

Inactive Publication Date: 2014-06-18
BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The brackets in the prior art are very inconvenient when used to calibrate the field uniformity of transient electromagnetic fields, and the calibration speed is slow

Method used

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  • Novel support used for calibrating transient electromagnetic field uniformity quickly
  • Novel support used for calibrating transient electromagnetic field uniformity quickly
  • Novel support used for calibrating transient electromagnetic field uniformity quickly

Examples

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Embodiment Construction

[0021] The content of the invention of the present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0022] The novel support provided by the present invention for quickly calibrating the uniformity of the transient electromagnetic field includes a support rod 1, a positioning ring 2, a rotating disk 3, a knob 4, a test rod 5 and a base 6, such as figure 1 shown. The positioning ring 2 is arranged on the top of the support rod 1 . In this embodiment, the positioning ring 2 is provided with a fixing seat 24 , and the positioning ring 2 is fixed on the top end of the support rod 1 through the fixing seat 24 . The bottom end of the support rod 1 is fixedly connected to the base 6 . The inner peripheral side of the locating ring 2 is provided with a plurality of grooves 21, and the center of the locating ring 2 is provided with at least one connecting key 22, one end of each connecting key 22 is affixed to the knob 4, and ...

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PUM

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Abstract

The invention discloses a novel support used for calibrating transient electromagnetic field uniformity quickly. The support comprises a supporting bar (1), a positioning ring (2), a rotary disk (3), a knob (4) and a test bar (5), wherein the positioning ring (2) is arranged on the top of the supporting bar (1). A plurality of grooves (21) are arranged in the inner periphery of the positioning ring (2), at least one connecting key (22) is arranged on the center of the positioning ring (2), one end of each connecting key (22) is fixedly connected with the knob (4), and the other end of each connecting key (22) is hinged with a positioning key (23). A flange (31) is arranged on one side of the rotary disk (3) and provided with a gap (32) matched with the positioning key (23), and the outer diameter of the flange (31) is smaller than the inner diameter of the positioning ring (2). A rotating shaft (33) is arranged in the center of the rotary disk (3). The flange (31) penetrates into the positioning ring (2), and the positioning key (23) can penetrate through the gap (32). The knob (4) is installed on the rotating shaft (33) and can rotate around the rotating shaft (33). The test bar (5) is fixedly connected on one side of the rotary disk (3). When the support is adopted in a system calibrating the transient electromagnetic field uniformity, calibrating speed can be accelerated obviously.

Description

technical field [0001] The invention relates to a support device, in particular to a novel support for quickly calibrating the field uniformity of transient electromagnetic fields. Background technique [0002] When calibrating field uniformity for transient electromagnetic fields, it is often necessary to apply a calibration system to test multiple locations. When calibrating the field uniformity of the transient electromagnetic field, not only a bracket is required to support and fix the test probe, but also the position of the test probe needs to be adjusted through the bracket. Specifically, when calibrating the field uniformity of the transient electromagnetic field, it is usually necessary to change the height of the probe by adjusting the bracket, or even change the position of the probe by moving the bracket. The support in the prior art is very inconvenient when used to calibrate the field uniformity of the transient electromagnetic field, and the calibration speed...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): F16M11/06F16M11/16F16M11/28G01R29/08
Inventor 姚利军沈涛黄建领
Owner BEIJING INST OF RADIO METROLOGY & MEASUREMENT