single-coat thick oxide film
An oxide film, oxide technology, applied in coating, metal material coating process, liquid chemical plating, etc., can solve the problems of HTS coating failure, intermediate film cracks, etc.
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Examples
Embodiment 1
[0112] Prepare the precursor solution as follows: add 6.0 grams of Y(CF 3 CO 2 ) 3 , 10.2 grams of Ba(CF 3 CO 2 ) 2 , 2.5 grams of Dy(O 2 CCH 3 ) 3 And 9.5 grams of Cu(CH 3 CH 2 CO 2 ) 2 Dissolve in 45 ml methanol and 1.5 ml HO 2 CCH 2 CH 3 in.
[0113] A slot die coater was used to deposit the precursor solution onto a continuous length of metal tape substrate.
[0114] The metal tape substrate is formed of four layers. The first layer is a deformed textured nickel-tungsten (5 atomic %) alloy with a thickness of about 75 microns and a width of about 46 mm. Deposit about 75 nanometers of Y on the nickel-tungsten textured surface 2 O 3 Epitaxial layer. In Y 2 O 3 A YSZ epitaxial layer (about 75 nm thick) is deposited on the layer. Deposit CeO on YSZ layer 2 The layer is an epitaxial layer (about 75 nm thick).
[0115] In H containing about 11 Torr 2 The precursor film is deposited in an atmosphere of O and the balance of nitrogen (total pressure is about 760 Torr). Coating weight ...
Embodiment 2
[0121] The intermediate film was formed in a manner similar to that described in Example 1, except that a single gas composition (water vapor pressure of 15 Torr) was used for processing. The thickness of the intermediate film is about 3 microns, measured by SEM cross-sectional analysis. Figure 5 This is an optical fiber micrograph (25 times magnification) of the film, showing that the film has many visually visible cracks.
Embodiment 3
[0123] The intermediate film was formed in a manner similar to that described in Example 1, except that a single gas composition (water vapor pressure of 28 Torr) was used for processing. Image 6 This is an optical fiber micrograph of the film (25 times magnification), showing that the film has many visually visible bubbles.
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Abstract
Description
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Application Information
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