Silicon carbide crystal growth furnace

A technology of crystal growth furnace and silicon carbide, applied in the direction of crystal growth, single crystal growth, single crystal growth, etc., can solve the problems of affecting crystal quality and unreasonable temperature distribution of crucible, and achieve the effect of ensuring reasonable distribution

Active Publication Date: 2016-01-06
BEIJING SEVENSTAR ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there are a large number of defects such as micropipes and dislocations that seriously affect the quality of the crystal, and the important factor for the generation of defects is the unreasonable temperature distribution inside the crucible

Method used

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  • Silicon carbide crystal growth furnace

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Embodiment Construction

[0020] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0021] Such as figure 1 As shown, the silicon carbide crystal growth furnace of the present invention includes: a vacuum unit, including: a dry pump 9, pneumatic flapper valves (4, 5), molecular pumps (6, 7), pneumatic valves ( 2, 3) and vacuum gauge 20, and the pressure gauge 18 connected with the pneumatic valve (2, 3), the pressure gauge 18 is used to display the vacuum degree in the furnace body; the mass flow meter group is used to inflate the furnace body The flow is controlled; the motion unit includes a coil movement control mechanism 11 and the heat insulation cover movement control mechanism 12; the heating unit includes a pyrometer 13, a radio frequency power s...

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Abstract

The invention discloses a silicon carbide crystal growth furnace which comprises a dry pump, also comprises a pneumatic gate valve, a molecular pump, a pneumatic valve and a vacuum gauge which are orderly connected with a furnace body, and a pressure gauge connected with the pneumatic valve; the furnace also comprises a motion unit which comprises a coil movement control mechanism and an heat insulation sleeve movement control mechanism, and a heating unit which comprises a pyrometer, a radio frequency power supply, a coil, a heat insulation sleeve disposed in the furnace body, and a crucible disposed in the heat insulation sleeve, wherein the radio frequency power supply is connected with the coil, and the heat insulation sleeve movement control mechanism and the coil movement control mechanism control the coil and the heat insulation sleeve to perform elevating movement. The device can reasonably control the air pressure inside the crucible during the SIC crystal growth process, control a radial temperature gradient in the crucible by using the matched movement of the coil and the heat insulation sleeve, optimize the pressure field and temperature field in the furnace, and thus ensure the reasonable distribution of the temperature in the crucible. Defects of the crystal are reduced to be the lowest, and thus the quality of the crystals is controlled.

Description

technical field [0001] The invention relates to the technical field of growth furnaces, in particular to a silicon carbide crystal growth furnace. Background technique [0002] Semiconductor integrated circuit single crystal has the characteristics of wide bandgap, high thermal conductivity, high electron saturation migration rate, high breakdown electric field, etc. It is suitable for manufacturing high-temperature, high-frequency, high-power, radiation-resistant, and corrosion-resistant electronic devices. Solid lighting, aerospace, communications, ocean exploration, earthquake prediction, oil drilling, and automotive electronic lamps are important fields, and are known as typical materials for third-generation semiconductors. At present, the physical vapor transport method (PVT method) is used for the crystal growth of most semiconductor integrated circuits commercially. At present, the growth of silicon carbide single crystal mainly adopts the PVT method. However, there...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): C30B29/36C30B23/00
Inventor黄鸣丁文革谭三成曹永新
OwnerBEIJING SEVENSTAR ELECTRONICS CO LTD