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Method based on radial basis network algorithm for acquiring yield of integrated circuits

An integrated circuit and yield technology, which is applied in the field of obtaining the yield of integrated circuits and can solve problems such as time-consuming

Inactive Publication Date: 2013-02-27
TSINGHUA UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Millions of samples are very time-consuming. Taking 1 second per sample as an example, it takes about 10 days to obtain the yield of an integrated circuit.

Method used

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  • Method based on radial basis network algorithm for acquiring yield of integrated circuits
  • Method based on radial basis network algorithm for acquiring yield of integrated circuits
  • Method based on radial basis network algorithm for acquiring yield of integrated circuits

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Embodiment Construction

[0021] The specific content of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0022] The basic process of the present invention is as figure 2 As shown, it specifically includes the following steps:

[0023] 1) According to the process parameter X provided by the IC process manufacturer, a radial basis network algorithm is used to establish a substitute model for circuit simulation (the function of the substitute model is to form an analytical mapping from process parameter X to circuit performance index f), and The process parameter X is used as an independent variable of the surrogate model, and the circuit performance index f is used as the function value of the surrogate model, that is, f=f(X), thus replacing the circuit simulation tool (the algorithm is developed by S.-F.Su, C.-C. Chuang, C.Tao, J.-T.Jeng and C.-C.Hsiao proposed that the title is radial basis network algorithm Radial basis...

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Abstract

The invention relates to a method based on radial basis network algorithm for acquiring yield of integrated circuits, belonging to the technical field of integrated circuits. The method includes the steps of: according to the technological parameters provided by an integrated circuit manufacturer and by adopting radial basis network algorithm, establishing a substitute model for replacing the circuit emulations by taking the technological parameters as the independent variables of the substitute model and the performance indexes of the circuits as the function values of the substitute model; acquiring a technological float value which is most easy for disabling the integrated circuits according to a minimum norm method; conducting systematic sampling on the acquired substitute model and the technological float value most easy for disabling the integrated circuits to acquire the sampling points and the performance indexes of the circuits; and acquiring the yield of the integrated circuits through a statistical approach according to the sampling points and the performance indexes of the circuits. The method has the advantages that the circuit emulation times in the process of acquiring the yield of the integrated circuits can be reduced, the time spent on analyzing the yield of the integrated circuits is reduced, the design cycle of the integrated circuits is shortened, the production of the integrated circuits is sped up, the cost of the integrated circuits is reduced and the economic value is increased.

Description

technical field [0001] The invention belongs to the technical field of integrated circuits, in particular to a method for obtaining the yield of integrated circuits. Background technique [0002] The production of integrated circuits is divided into two stages. In the first stage, the designer of the integrated circuit designs the integrated circuit: the designer performs simulation analysis on the designed integrated circuit through the integrated circuit simulation tool, and obtains the performance of the designed integrated circuit. When the designed performance meets the requirements, the designer hands over the designed integrated circuit design scheme to the integrated circuit manufacturer. In the second stage, integrated circuit manufacturers manufacture integrated circuits: manufacturers use integrated circuit technology to manufacture integrated circuit products that meet the designer's requirements according to the integrated circuit design scheme provided by the ...

Claims

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Application Information

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IPC IPC(8): G06F17/50
Inventor 叶佐昌姚健王燕
Owner TSINGHUA UNIV
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