Method based on radial basis network algorithm for acquiring yield of integrated circuits
An integrated circuit and yield technology, which is applied in the field of obtaining the yield of integrated circuits and can solve problems such as time-consuming
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[0021] The specific content of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0022] The basic process of the present invention is as figure 2 As shown, it specifically includes the following steps:
[0023] 1) According to the process parameter X provided by the IC process manufacturer, a radial basis network algorithm is used to establish a substitute model for circuit simulation (the function of the substitute model is to form an analytical mapping from process parameter X to circuit performance index f), and The process parameter X is used as an independent variable of the surrogate model, and the circuit performance index f is used as the function value of the surrogate model, that is, f=f(X), thus replacing the circuit simulation tool (the algorithm is developed by S.-F.Su, C.-C. Chuang, C.Tao, J.-T.Jeng and C.-C.Hsiao proposed that the title is radial basis network algorithm Radial basis...
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