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Test device and test method for sampling rate of large aperture sampling grating

A sampling grating and testing device technology, applied in the optical field, achieves the effects of short test time, high measurement accuracy and small measurement error

Inactive Publication Date: 2016-06-08
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0006] In order to solve the above-mentioned technical problems existing in the background technology, the present invention provides a test device and a test method for the sampling rate of large-aperture sampling gratings that can solve the problem of testing the sampling rate of large-aperture sampling gratings and ensure the test accuracy.

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  • Test device and test method for sampling rate of large aperture sampling grating
  • Test device and test method for sampling rate of large aperture sampling grating
  • Test device and test method for sampling rate of large aperture sampling grating

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Embodiment Construction

[0026] see figure 1 , the present invention provides a method and device for testing the sampling rate of a large-aperture sampling grating. Dimensional electronically controlled scanning mirror group (X direction scanning mirror 7 and Y direction scanning mirror 8), integrating sphere power meter (first integrating sphere power meter 6 and second integrating sphere power meter 10) and control and acquisition processing system 11.

[0027] The beam splitter 5 is placed on the outgoing light path of the laser 1; the first integrating sphere power meter 6 is placed on the transmitted light path through the beam splitter 5; the two-dimensional scanning mirror group is placed on the reflected light path through the beam splitter 5; Two integrating sphere power meters 10 are placed on the optical path through the -1 order diffraction of the measured sampling grating 9 after passing through the two-dimensional scanning mirror group; the first integrating sphere power meter 6 and the...

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Abstract

The invention relates to a testing device and a testing method of a big diameter sampling grating sampling rate, wherein the testing device of the big diameter sampling grating sampling rate comprises a laser device, a beam splitter, a first integral ball power meter, a second integral ball power meter, a two dimensional scan mirror group used for scanning a big diameter sampling grating and a controlling and collecting processing system. The beam splitter is arranged on an emergent light path of the laser device, the first integral ball power meter is arranged on a transmission light path which passes the beam splitter, the two dimensional scan mirror group is arranged on a reflected light path which passes the beam splitter, the second integral ball power meter is arranged on a -1 level diffraction light path which penetrates a tested sampling grating after passing the two dimensional scan mirror group, and the first integral ball power meter and the second integral ball power meter are respectively connected with the controlling and collecting processing system. According to the testing device and a testing method of a big diameter sampling grating sampling rate, testing problems of the big diameter sampling grating sampling rate are resolved and testing precision is well guaranteed.

Description

technical field [0001] The invention belongs to the field of optics, and relates to a testing device and a testing method for a grating sampling rate, in particular to a testing device and a testing method for a large-aperture sampling grating sampling rate. Background technique [0002] In the terminal shooting range subsystem of the inertial confinement fusion system, before the triple frequency laser enters the terminal shooting range, a sampling grating (BSG) is required to sample the transmitted triple frequency laser to the laser parameter diagnosis system in a certain proportion. The sampling grating is a sampling element suitable for the entire wavelength range. It can be applied to the sampling of large-aperture beams, and provides sampling beams for the laser parameter diagnosis system without affecting the main beam. In order to ensure the energy of the main beam hitting the target, the sampling efficiency of the sampling beam is generally below 5‰. Limited by th...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02G01J1/00
Inventor 陈永权赵建科段亚轩李霞李坤赛建刚
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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