Mechanical property testing method based on atomic force microscope probe
An atomic force microscope and testing method technology, applied in scanning probe technology, scanning probe microscopy, measuring device, etc., can solve problems such as mechanical property testing and characterization
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[0024] The present invention provides a method for testing mechanical properties based on an atomic force microscope probe. In order to make the purpose, technical solution and effect of the present invention clearer and clearer, the present invention will be further described in detail below. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0025] Please also refer to figure 1 and figure 2 ,in figure 1 It is a flowchart of a preferred embodiment of the method for testing mechanical properties based on an atomic force microscope probe according to the present invention, figure 2 It is a structural schematic diagram of the scanning electron microscope in-situ detection device in the present invention. Such as figure 1 and figure 2 Shown, described based on the mechanical property testing method of atomic force microscope probe, comprises the following steps:
[002...
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