Mechanical property testing method based on atomic force microscope probe

An atomic force microscope and testing method technology, applied in scanning probe technology, scanning probe microscopy, measuring device, etc., can solve problems such as mechanical property testing and characterization

Inactive Publication Date: 2017-05-10
SHENZHEN XIWAN TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In view of the above-mentioned deficiencies in the prior art, the purpose of the present invention is to provide a mechanical property testing method based on an atomic force microscope probe, aiming to solve the

Method used

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  • Mechanical property testing method based on atomic force microscope probe
  • Mechanical property testing method based on atomic force microscope probe
  • Mechanical property testing method based on atomic force microscope probe

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Embodiment Construction

[0024] The present invention provides a method for testing mechanical properties based on an atomic force microscope probe. In order to make the purpose, technical solution and effect of the present invention clearer and clearer, the present invention will be further described in detail below. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0025] Please also refer to figure 1 and figure 2 ,in figure 1 It is a flowchart of a preferred embodiment of the method for testing mechanical properties based on an atomic force microscope probe according to the present invention, figure 2 It is a structural schematic diagram of the scanning electron microscope in-situ detection device in the present invention. Such as figure 1 and figure 2 Shown, described based on the mechanical property testing method of atomic force microscope probe, comprises the following steps:

[002...

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Abstract

The invention discloses a mechanical property testing method based on atomic force microscope probe. The method comprises: fixing an atomic force microscope probe to the top end of a Z-axis mobile platform at the in-situ detection device of a scanning electronic microscope; placing a sample consisting of carbon nanotubes and resin composite materials in a sample placement region; moving the X-axis platform and the Y-axis platform; letting the atomic force microscope probe in contact with the sample and then letting them attached through electronic beam radiation; starting the photographing of the electronic microscope and moving the X-axis platform and the Y-axis platform so as to draw the sample out of the single carbon nanotube; according to the photographed multi-frame continuous images, obtaining the displacement of the atomic force microscope when the single carbon nanotube is drawn out as well as the elasticity coefficient of the atomic force microscope so as to obtain the interface mechanical performance between the single carbon nanotube and the resin. The method of the invention realizes the dynamic in-situ observation of a material from nanometer scale to micrometer scale, and can test its mechanical properties at the same time.

Description

technical field [0001] The invention relates to the technical field of testing instruments, in particular to a method for testing mechanical properties based on an atomic force microscope probe. Background technique [0002] Nanomaterials and nanotechnology are one of the research fields that countries have paid great attention to and paid attention to in recent years. When the size of a substance is reduced to the nanometer level, its physical properties, chemical properties, and other properties will be greatly different or even completely different from those it exhibits at the macroscopic level (micron millimeter level) . The unique properties endowed by the nanoscale to various materials have also attracted more and more researchers and institutions to engage in scientific research and technological development of nanomaterials. [0003] Take carbon nanotube materials as an example. Carbon nanotubes are typical one-dimensional nanomaterials, which have excellent mech...

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Application Information

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IPC IPC(8): G01Q60/24
CPCG01Q60/24
Inventor 邓飞
Owner SHENZHEN XIWAN TECH CO LTD
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