Visual inspection device and visual inspection method

一种外观检查装置、外观检查的技术，应用在图像分析、图像增强、光学测试瑕疵/缺陷等方向，能够解决判定标准降低等问题

Active Publication Date: 2013-07-10
KEYENCE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is a problem in some cases that performing additional learning may lead to a lowering of the judgment standard, and an image of an item that should have been judged as a defective item may become an image incorrectly judged as a non-defective item

Method used

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  • Visual inspection device and visual inspection method
  • Visual inspection device and visual inspection method
  • Visual inspection device and visual inspection method

Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0058] A visual inspection device according to an embodiment of the present invention will be described below with reference to the drawings. It should be noted that elements having the same or similar configuration or function in all the drawings referred to in the description of the embodiment are provided with the same or similar reference numerals, and detailed descriptions thereof are omitted.

[0059] figure 1 is a schematic view showing the configuration of a product inspection system including an appearance inspection device according to an embodiment of the present invention. Such as figure 1 As shown, the product inspection system including the appearance inspection device according to the present invention includes a camera 1 and an appearance inspection device 2 , and the appearance inspection device 2 and the camera 1 are connected by a connecting cable 10 in a data communicable manner. The appearance inspection device 2 is connected to a display device (not sho...

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PUM

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Abstract

Inputs of a plurality of images constituting a group of images of items regarded as non-defective items are accepted and stored, and a defect threshold for detecting a defective portion of an inspection object and a determination threshold for making a non-defective / defective determination are set based on the plurality of stored images. A defective item image which is an image of an item determined as a defective item is previously stored and when an input of an image newly acquired by capturing an inspection object is accepted, non-defective item learning processing is performed by use of a plurality of stored images including the image whose input has been accepted, to at least reset the defect threshold. A defective portion is re-detected based on the reset defect threshold, to determine whether or not the stored defective item image is an image of a defective item based on the set determination threshold.

Description

technical field [0001] The present invention relates to an appearance inspection device and an appearance inspection method for deleting an image of an article judged to be a defective article from among a group of images obtained by photographing an inspection object and storing images of articles judged to be non-defective articles , and computer programs. Background technique [0002] Hitherto, an appearance inspection method has been developed in which an image obtained by photographing an inspection object is compared with an image of an inspection object as a standard to determine whether the inspection object is a non-defective article. The images used as the above judgment criteria are images of items judged as non-defective by visual inspection, and are compared with images acquired by photographing inspection objects to set a judgment threshold for non-defective / defective judgment. [0003] In order to correctly determine a non-defective item as a non-defective it...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
CPCG06T7/001G06T2200/24G06T2207/20081G06T2207/30164G06T7/0004
Inventor 平野高志
Owner KEYENCE
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