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Stored data test method, device and system

A technology for storing data and testing methods, applied in the field of embedded automated testing, can solve problems such as low efficiency, and achieve the effect of realizing intelligence and improving test efficiency and accuracy.

Active Publication Date: 2013-10-30
GREE ELECTRIC APPLIANCES INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The present invention provides a stored data testing method, device and system to at least solve the problem in related technologies that the testing of IIC chip stored data is manual operation and low efficiency

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  • Stored data test method, device and system

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Embodiment Construction

[0032] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0033] In the related technology, the test of the data stored in the IIC chip is completely manual, which has low efficiency and low accuracy, and requires programming equipment, resulting in high cost. Therefore, a testing method with high efficiency, intelligence, high testing accuracy and low cost is needed. An embodiment of the present invention provides a storage data testing method, figure 1 is a flowchart of a storage data testing method according to an embodiment of the present invention, such as figure 1 As shown, the following steps S102 to S106 are included.

[0034] Step S102, reading the stored data of the IIC chip through the ARM tooling.

[0035] Step S104, comparing the stor...

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Abstract

The invention discloses a stored data test method, device and system. The method comprises steps of reading stored data of an IIC chip through an ARM tool; comparing the stored data with preset default data; generating a comparison report according to comparison results. By automatically reading the stored data of the IIC chip, comparing the stored data with the default data and generating the comparison report, intelligentialize of a stored data test is achieved, and the test efficiency and accuracy rate are improved.

Description

technical field [0001] The invention relates to the field of embedded automatic testing, in particular to a storage data testing method, device and system. Background technique [0002] At present, all electronic products involving program development are facing reliability problems. How to improve product quality must have reliable experimental test method verification, and IIC chips have a lot of data, and verification is difficult. [0003] The current more advanced test method is as follows: use ALL11 and other chip programming equipment to read the data stored in the IIC chip, then save the data to the PC, and then manually put it into the EXCEL table, use the known definition table and the data to be saved comparing. Then manually check the comparison results and generate a comparison report. [0004] The above method is completely manual, and the efficiency of test data is low. It takes 2 to 5 days (depending on the amount of data) to test an IIC chip, and the test ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
Inventor 郭华定
Owner GREE ELECTRIC APPLIANCES INC