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Short circuit inspection method

A short-circuit defect detection technology, which is applied in the direction of measuring devices, instruments, and measuring electrical variables, can solve the problems of inspection work limitations, difficulty in detecting the location of short-circuit defects, etc., and achieve the effect of easy inspection

Active Publication Date: 2018-07-20
SAMSUNG DISPLAY CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, it is difficult to detect the location of the short defect between these overlapped cables
In particular, with the increase in the number of cables and the complexity of the shape of the cables, it brings limitations to the inspection work

Method used

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Embodiment Construction

[0045] Hereinafter, the constitution and function of the present invention will be described in detail with reference to the embodiments of the present invention shown in the drawings.

[0046] figure 1 is a schematic plan view showing an organic light emitting display device according to an embodiment of the present invention, figure 2 yes figure 1 A brief schematic diagram of the wiring structure in the middle II area.

[0047] Such as figure 1 and figure 2 As shown, a display area A1 and a non-display area A2 are formed on the substrate 10 of the organic light emitting display device 1 of this embodiment.

[0048] The display area A1 is used as an area for displaying an image, and is formed in an area including a central portion of the substrate 10 . The non-display area A2 may be provided around the display area A1.

[0049] The display area A1 includes a plurality of pixels P representing images.

[0050]Each pixel P may be defined by a scan line S extending alon...

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Abstract

The present invention provides a method for detecting a first cable portion extending along a first direction and a second direction intersecting the first direction and a second cable extending along the first direction or the second direction A method for a short circuit defect between parts, wherein the method detects a short circuit defect between the first wiring part and the second wiring part only through the potential difference of the second wiring part.

Description

technical field [0001] The invention relates to a method for inspecting short-circuit defects, a method for inspecting short-circuit defects of a display device, and a method for inspecting short-circuit defects of an organic light-emitting display device. Background technique [0002] Recently, portable thin flat panel display devices are gradually replacing display devices. Among flat-panel display devices, organic light-emitting display devices, as self-luminous display devices, not only have the advantages of wide viewing angle and excellent contrast ratio, but also have the advantages of fast response speed, so they are attracting attention as next-generation display devices. [0003] An organic light emitting display device includes an intermediate layer, a first electrode and a second electrode. The intermediate layer includes an organic light emitting layer. The organic light emitting layer generates visible light when a voltage is applied to the first electrode an...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G09G3/00
CPCG09G3/006G09G3/3233G09G2300/0819G09G2300/0852G01R19/10
Inventor 李俊雨崔宰凡郑宽旭崔成寿金成俊金广海金佳英金志训
Owner SAMSUNG DISPLAY CO LTD