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Semiconductor storage system using regression analysis and reading method thereof

A storage system, storage unit technology, applied in information storage, static memory, read-only memory, etc.

Active Publication Date: 2019-04-16
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, memory cells in MLC memory devices must have threshold voltages corresponding to four or more distinguishable data states within a limited voltage window

Method used

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  • Semiconductor storage system using regression analysis and reading method thereof
  • Semiconductor storage system using regression analysis and reading method thereof
  • Semiconductor storage system using regression analysis and reading method thereof

Examples

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Embodiment Construction

[0045]Example embodiments will be described in detail with reference to the accompanying drawings. However, the inventive concept may be embodied in a variety of different forms and should not be regarded as presenting only the illustrated example embodiments. Rather, these example embodiments are provided by way of example so that this disclosure will be thorough and complete, and will fully convey the concept of the inventive concept to those skilled in the art. Accordingly, known procedures, elements and techniques are not described with respect to some of the example embodiments of inventive concepts. Unless otherwise indicated, like reference numerals denote like elements throughout the drawings and descriptions, and thus descriptions will not be repeated. In the drawings, the size and relative sizes of layers and regions may be exaggerated for clarity.

[0046] It should be understood that although the terms "first", "second", "third", etc. may be used herein to descri...

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Abstract

A storage system and a reading method thereof are provided. The storage system includes: a bit counter and a regression analyzer. The bit counter is configured to generate a plurality of count values ​​based on data read from the selected memory cell using a plurality of different read voltages, each of the plurality of count values ​​being indicative of a plurality of different read voltages. The voltage is the threshold voltage between a pair of read voltages, the number of memory cells of the memory device. The regression analyzer is configured to determine a read voltage for the selected memory cell based on the plurality of count values ​​using regression analysis.

Description

[0001] Cross References to Related Applications [0002] This application claims priority under U.S.C §119 to Korean Patent Application No. 10-2012-0119106 filed with the Korean Intellectual Property Office on Oct. 25, 2012, the entire contents of which are hereby incorporated by reference. technical field [0003] The inventive concept described herein relates to a semiconductor memory device, and more particularly, to a memory system capable of deciding a read level at high speed and a read method thereof. Background technique [0004] Semiconductor memory devices may be volatile or nonvolatile. Volatile semiconductor memory devices can perform read and write operations at high speed, and the contents stored in them may be lost when the power is turned off. A nonvolatile semiconductor memory device retains the contents stored therein even when power is lost. Non-volatile semiconductor memory devices can be used to store content that must be retained regardless of power-o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C16/06G11C16/26
CPCG11C11/5642G11C16/0483G11C16/3422G11C16/349G11C16/26G11C16/34G11C16/10
Inventor 金广勋孔骏镇薛昶圭孙弘乐
Owner SAMSUNG ELECTRONICS CO LTD
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