mom capacitance

A capacitor and electrode technology, applied in the field of semiconductor integrated circuit devices, can solve the problems of capacitor occupation and low capacitor density.

Active Publication Date: 2016-06-08
SHANGHAI HUAHONG GRACE SEMICON MFG CORP
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Capacitors are widely used in RF circuits, such as metal-insulator-metal (MiM) capacitors and MOM capacitors, but capacitors are often very area-occupied devices, and their capacitance density is relatively small

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • mom capacitance
  • mom capacitance
  • mom capacitance

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] Such as Figure 4A As shown, it is a schematic structural diagram of a MOM capacitor according to Embodiment 1 of the present invention; a MOM capacitor according to Embodiment 1 of the present invention: includes a multi-layer metal coil, and each layer of metal coil is formed by nesting two metal sub-coils; Figure 4A shows two adjacent layers of metal coils, namely the upper layer metal coil 1 and the lower layer metal coil 2. The upper metal coil 1 is formed by nesting a first metal sub-coil 11 and a second metal sub-coil 12 . The lower metal coil 2 is formed by nesting a first metal sub-coil 21 and a second metal sub-coil 22 .

[0033] Both the first metal sub-coil 11 and the second metal sub-coil 12 are respectively formed by a metal wire, the winding direction is the same, and the number of turns is also the same. The first metal sub-coil 11 loops clockwise between the outer port 11a and the inner port 11b, and the second metal sub-coil 12 loops clockwise betwe...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
widthaaaaaaaaaa
lengthaaaaaaaaaa
Login to view more

Abstract

The invention discloses an MOM capacitor which is formed by a plurality of layers of metal coils. Each layer of metal coil is formed by nesting two metal sub-coils. The two metal sub-coils of each layer of metal coil form a transverse capacitor structure, that is, the two metal sub-coils form two pole plates of the capacitor; and two metal sub-coils at the upper and lower adjacent two sides are connected together through a through hole. The two pole plates of the MOM capacitor are respectively formed by the metal coils; and since the metal coils have relatively-large parasitic inductance, equivalent capacitance of the MOM capacitor can be improved, capacitance density is increased and circuit area is reduced.

Description

technical field [0001] The invention relates to a semiconductor integrated circuit device, in particular to a metal-oxide-metal (MOM) capacitor. Background technique [0002] Capacitors are widely used in radio frequency circuits, such as metal-insulator-metal (MiM) capacitors and MOM capacitors, but capacitors are often very area-consuming devices, and their capacitance density is relatively small. As the demand for integration becomes higher and higher, the requirement for capacitance density is also higher and higher. [0003] The capacitance density of existing MiM capacitors is generally 2fF / μm 2 Left and right, the existing MOM capacitor structure has three structures. [0004] Such as figure 1 As shown, it is a structural schematic diagram of the first existing MOM capacitor; the first MOM capacitor is a horizontal bar structure (HorizontalBarsm, HB), including multiple metal layers, and each metal layer includes metal bars 101 and 102, A capacitance of a lateral ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/522
Inventor 黄景丰
Owner SHANGHAI HUAHONG GRACE SEMICON MFG CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products