Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

DEM-based automatic identification and boundary extraction method of moon surface impact crater

An automatic recognition and boundary extraction technology, applied in character and pattern recognition, instruments, calculations, etc., can solve the problems of poor recognition of complex lunar surface areas and rarely considering the overlapping relationship of impact craters

Inactive Publication Date: 2014-07-16
SHANDONG UNIV
View PDF2 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] (2) The overlapping relationship between impact craters is rarely considered, and the identification effect on complex lunar surface areas is not good

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • DEM-based automatic identification and boundary extraction method of moon surface impact crater
  • DEM-based automatic identification and boundary extraction method of moon surface impact crater
  • DEM-based automatic identification and boundary extraction method of moon surface impact crater

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0081] The present invention is described in detail below in conjunction with accompanying drawing:

[0082] As shown in Figure 1, the DEM map of the original lunar surface, the spatial range is the latitude and longitude [73°, -5°] in the upper left corner, and [83°, 5°] in the lower right corner. The present invention classifies the nested and overlapping impact craters according to their spatial scales, firstly identifies the impact craters with the smallest size, and then sequentially identifies the impact craters with larger sizes until all the impact craters are identified. In order to identify impact craters of different scales, the original elevation domain G is transformed into an artificial terrain domain L with a spatial scale of λ using the spatial transformation theory λ , used to extract impact craters with a spatial scale of λ. When identifying, set the λ cycle to gradually increase, so that it gradually increases from the smallest scale to the largest scale, a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a DEM-based automatic identification and boundary extraction method of a moon surface impact crater. The method comprises the following steps that 1, catchment analysis is conducted on a moon surface DEM elevation domain, and catchment dividing and generating are conducted; 2, spatial alternation is conducted on the DEM elevation domain, and the processed moon surface elevation domain is changed to an artificial terrain domain to be used for identifying sunken areas of different sizes; 3, edge expanding is conducted on the sunken areas through a neighborhood expansion algorithm, and a complete impact crater area is obtained; 4, the boundary of the impact crater area is fitted through the Fourier Series, and the precise shape of the impact crater is extracted. The problem that the complex moon surface is complex due to the overlaying impact craters and is difficult to identify completely is solved, the integrity of the identifying result is guaranteed, the boundary of the impact crater object is fitted through the Fourier Series, and the actual shape parameter of the crater is extracted, and accuracy of the extraction result is guaranteed.

Description

technical field [0001] The invention relates to the fields of computer graphics and digital terrain analysis, in particular to a DEM-based method for automatic identification and boundary extraction of lunar impact craters. Background technique [0002] Ring structures, especially impact craters, are the most prominent topographic features on the lunar surface. The analysis and research on the distribution characteristics, morphological structure and quantity of impact craters has very important scientific significance and application value. [0003] Early impact crater vectorization mainly adopted the method of manual identification, and now automatic or semi-automatic identification methods are mostly used, mainly including methods based on shape fitting, machine learning, and geoscience information: First, the shape of impact craters is mostly circular and elliptical Based on shape fitting, Hough transform, quadratic curve fitting and template matching are mainly used to...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/54
Inventor 李勃凌宗成张江武中臣倪宇恒孙灵芝陈剑
Owner SHANDONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com