A method and device for testing the electrical performance of pogo pins
An electrical performance, technology to be tested, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problems of inaccurate test results, small size of pogopin, poor electrical performance, etc., to achieve accurate and fast electrical performance and convenience The effect of the test
Active Publication Date: 2017-03-22
SHENZHEN FASTPRINT CIRCUIT TECH +2
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Problems solved by technology
At present, the industry can only test the structure and performance of pogo pins, but cannot conduct electrical performance tests on pogo pins (because of the small size of pogo pins, few electrical testing equipment can be directly connected to the pins of pogo pins)
Therefore, when testing the electrical performance of an IC, sometimes the test result may be inaccurate due to the poor electrical performance of the pogo pin, so that the electrical performance of a good IC is not good.
Method used
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Embodiment Construction
[0025] refer to figure 1 , a method for testing the electrical performance of pogo pins, including:
[0026] A. Design the PCB verification board corresponding to the upper PCB splint and the lower PCB splint;
[0027] B. Carry out TRL calibration on the PCB verification board, so as to reset the electrical performance parameters of the upper PCB splint and the lower PCB splint to zero;
[0028] C. Perform an electrical performance test on the module to be tested consisting of the pogo pin, the upper PCB splint and the lower PCB splint, thereby obtaining the electrical performance parameters of the pogo pin. The upper PCB splint is connected to the lower PCB splint through the pogo pin.
[0029] The present invention applies the existing high-precision TRL de-embedding technology to the electrical performance test parameters of pogo pins, and resets the electrical performance parameters of the upper PCB splint and the lower PCB splint to zero by performing TRL check on the PC...
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The invention discloses a testing method and device for pogo pin electrical performance. The device includes an upper PCB clamping plate, a lower PCB clamping plate, a pogo pin, a testing device and a PCB calibration plate used for eliminating effects from the upper PCB clamping plate and the lower PCB clamping plate. The upper PCB clamping plate is connected with the lower PCB clamping plate through the pogo pin. The upper PCB clamping plate and the lower PCB clamping plate are both connected with the testing device. The device solves a problem that in the prior art, electrical-performance testing cannot be accurately carried out on the pogo pin and is capable of conveniently testing electrical-performance parameters of the pogo pin so that we master the electrical performance of the pogo pin more accurately and rapidly and thus the pogo pin is enabled to be better applied to IC testing. The testing method and device for the pogo pin electrical performance is widely applicable to the field of testing of integrated circuits.
Description
technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a method and a device for testing the electrical performance of pogo pins. Background technique [0002] Pogo pin (probe connector) is a precision connector used in electronic products such as mobile phones. It is widely used in semiconductor equipment for connection. [0003] With the development of the electronics industry, various circuits tend to be integrated, and IC packages are getting smaller and smaller. In the integrated circuit industry, it is often necessary to test the electrical performance of the IC to judge whether the IC is good or bad. At this time, pogo pins are used for the convenience of testing. However, the performance of the pogo pin will affect the correctness of the IC test results to a certain extent, so it is necessary to clearly and accurately know the performance parameters of the pogo pin itself (including structure, performance and electr...
Claims
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IPC IPC(8): G01R31/00
Inventor 蒋修国谈炯尧邓宝明
Owner SHENZHEN FASTPRINT CIRCUIT TECH