Temperature rise test reverse power supply system

Abstract

The invention provides a temperature rise test reverse power supply system which comprises a low-voltage switchgear assembly and a plurality of movable type branch circuit reverse power supply systems. Each output loop in the low-voltage switchgear assembly is connected with one movable type branch circuit reverse power supply system. The incoming line end of the low-voltage switchgear assembly is in a short circuit. Each movable type branch circuit reverse power supply system outputs an actual test current consistent with the rated test current to the corresponding output loop, and the actual test current of the corresponding output loop can be automatically adjusted when the internal impedance is increased in the temperature rise test process of the low-voltage switchgear assembly so that the actual test current of the corresponding output loop can be kept to be consistent with the rated test current. According to the temperature rise test reverse power supply system, stability of the temperature rise test current can be ensured, the accuracy of a temperature rise test result is improved, and the test energy consumption and the test labor cost are reduced.

Description

technical field [0001] The present application relates to the technical field of power electronics, in particular to a temperature rise test feedback power supply system. Background technique [0002] Among the test items of low-voltage switchgear, "temperature rise test" is the most important assessment content. [0003] For a long time, the temperature rise test of low-voltage switchgear has adopted the rated input current (i.e. low-voltage high current) to the main incoming circuit of low-voltage switchgear. The respective rated output current is obtained in the incoming circuit, so that the whole circuit maintains a balance between the input current and the output current (that is, I 额定输入电流 =I 额定输出电流1 +I 额定输出电流2 +I 额 定输出电流3 +...+I 额定输出电流n , where n is equal to the number of output loops), see figure 1 , figure 1 It shows the schematic diagram of the temperature rise test of the medium and low-voltage complete switchgear in the prior art. The low-voltage complete ...

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Problems solved by technology

[0006] 1. During the temperature rise test, the staff needs to adjust the impedance of each output circuit frequently. Due to the inaccurate manual operation, the current error of each output circuit is relatively large, which affects the accuracy of the temperature rise test results.

[0007] 2. During the power-on process of the temperature rise test of the low-voltage complete switchgear, it often occurs that the circuit breaker installed in a certain output circuit will accidentally trip due to excessive temperature rise. Once this happens, it will cause other output circuits. The current increases rapidly, causing the circuit breaker in the new output circuit to trip by mistake, causing a chain reaction, causing the circuit breaker in each output circuit to trip by mistake due to the change of current, and finally causing the temperature rise test to be interrupted

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