SPR (Surface Plasma Resonance) based reflective index sensor with high sensitivity and wide measurement range

A surface plasmon and refractive index sensor technology, which is applied in the measurement of scattering characteristics and phase influence characteristics, etc., can solve the problems of narrow measurement range, low sensitivity, complex sensor head structure, etc., and achieve the effect of real-time online detection

Active Publication Date: 2015-01-14
鞍山峰澜科技有限公司
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Problems solved by technology

[0005] In order to overcome the problems of complex structure, narrow measurement range and low sensitivity of the surface plasmon resonance (SPR) sensor based on the optical fiber structure, t

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  • SPR (Surface Plasma Resonance) based reflective index sensor with high sensitivity and wide measurement range
  • SPR (Surface Plasma Resonance) based reflective index sensor with high sensitivity and wide measurement range

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[0015] The invention is further described below in conjunction with the accompanying drawings.

[0016] Such as figure 1 As shown, the refractive index sensor based on surface plasmon resonance with high sensitivity and wide measurement range includes: broadband light source 1, optical isolator 2, polarization controller 3, microfluidic channel 5, side-polished single-mode fiber 4, carrier A chip 6 coated with a gold film on a glass slide, a spectrometer 7, and a microflow pump 8;

[0017] The working mode of the present invention is: the broadband light source 1 generates signal light, which is input to the optical isolator 2 by the single-mode transmission fiber, and the optical signal output by the optical isolator 2 is controlled by the polarization controller 3 to become P polarized light, and the P polarized light Coupled to the side-polished single-mode fiber 4, due to the reduction in the thickness of the side-polished single-mode fiber cladding, some modes of the cor...

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Abstract

The invention discloses an SPR (Surface Plasma Resonance) based reflective index sensor with high sensitivity and a wide measurement range. The SPR based reflective index sensor is characterized by comprising a laser source, an optical isolator, a polarization controller, a microfluidic channel, a side polishing and grinding mono-mode optical fiber, a chip coated with a gold film on a glass slide, a spectrometer and a microfluidic pump, wherein an SPR sensing area comprises the chip coated with the gold film on the glass slide, the microfluidic channel and the side polishing and grinding mono-mode optical fiber; the microfluidic channel is formed in a residual cladding of the side polishing and grinding mono-mode optical fiber by virtue of a photo-etching technology; the chip coated with the gold film on the glass slide is formed by sputtering the gold film on the surface of a silicon substrate by virtue of an ion sputtering technology. Due to a strong evanescent field in the microfluidic channel and the SPR effect, great excursion is generated by an SPR wavelength when the reflective index of the microfluidic channel slightly changes; a great effective reflective index difference is generated on an interface between the chip coated with the gold film on the glass slide and the microfluidic channel, and thus the measurement range is widened. The SPR based reflective index sensor is practical and is low in cost.

Description

technical field [0001] The invention belongs to the technical field of optical fiber sensing, in particular to a refraction index sensor with high sensitivity and wide measurement range based on surface plasmon resonance. Background technique [0002] Surface Plasmon Resonance (SPR) means that when the P-type polarized polychromatic light emitted by the light source passes through the interface between the thin film metal and the medium, if the incident angle is greater than the critical angle of total reflection, an electron concentration is formed on the surface. Due to the existence of the surface evanescent wave field and the complex refractive index of the metal, the light that satisfies the resonance wavelength is partially absorbed, and the light of the remaining wavelengths is reflected. In 1968, German physicists Otto and Kretschmann respectively used the (Attenuated Total Reflection, ATR) method to realize the excitation of surface plasmons in the optical frequency...

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Application Information

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IPC IPC(8): G01N21/41G01N21/55
Inventor 赵春柳王小明王雁茹时菲菲
Owner 鞍山峰澜科技有限公司
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